NIST logo

Publications Portal

You searched on:
Author: james kushmerick
Sorted by: date

Displaying records 1 to 10 of 16 records.
Resort by: Date / Title


1. Characterization of a High-Speed (10 MHz) Quadrant Avalanche Photodiode for Measuring Cantilever Displacement
Published: 9/16/2012
Authors: Brian Gregory Burke, David A LaVan, James G. Kushmerick
Abstract: We have measured the characteristics of a high-speed (10 MHz) quadrant avalanche photodiode (APD) in order to detect high frequency resonant oscillations and tip displacements of a cantilever. Currently, no high-speed quadrant detectors with a resp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906903

2. Investigation of damage mechanisms in PMMA during ToF-SIMS depth profiling with 5 keV and 8 keV SF5+ primary ions.
Published: 9/2/2010
Authors: Christine M. Mahoney, James G. Kushmerick, Kristen L Steffens
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) has been proven to be a useful technique for the surface and in-depth characterization of molecular films. Here, an SF5+ polyatomic primary ion source is utilized for depth profiling in poly(met ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904766

3. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907141

4. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 5/1/2010
Authors: L C Teague, Oana Jurchescu, Curt A Richter, Sanker Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James Kushmerick
Abstract: We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907043

5. Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Published: 12/2/2008
Authors: Lucile C. Teague, Behrang H Hamadani, John E Anthony, David J Gundlach, James G. Kushmerick, Sanker Subramanian, Thomas Jackson, Curt A Richter, Oana Jurchescu
Abstract: We report scanning Kelvin probe microscopy (SKPM) of electrically biased difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) organic thin film transistors. SKPM reveals the relationship between the diF-TESADT film structure and device ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831446

6. Molecule induced interface states dominate charge transport in Si-alkyl-metal junctions
Published: 8/26/2008
Authors: Lam H. Yu, Nadine Emily Gergel-Hackett, Christopher D Zangmeister, Christina Ann Hacker, Curt A Richter, James G. Kushmerick
Abstract: Abstract. Semiconductor-molecule-metal junctions consisting of alkanethiol mono- layers self-assembled on both p+ and n¡ type highly doped Si(111)wires contacted with a 10 ¹m Au wire in a crossed-wire geometry are examined. Low temperature transpo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832205

7. Controlling charge-carrier type in nanoscale junctions with linker chemistry
Published: 8/1/2008
Authors: Christopher D Zangmeister, J M. Beebe, Jawad Naciri, James G. Kushmerick, Roger D van Zee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902681

8. Contact Induced Crystallinity for High Performance Soluble Acene-Based TFTs
Published: 2/17/2008
Authors: David J Gundlach, James Royer, Behrang H Hamadani, Lucile C. Teague, Andrew J Moad, Oana Jurchescu, Oleg A Kirillov, Lee J Richter, James G. Kushmerick, Curt A Richter, Sungkyu Park, Thomas Jackson, Sankar Subramanian, John E Anthony
Abstract: Organic electronics present a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. However, the lack of low-temperature low-cost deposition and patterning techniques limits the potential for th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32683

9. Tracing Electronic Pathways in Molecules Using Inelastic Tunneling Spectroscopy
Published: 9/4/2007
Authors: Alessandro Troisi, J M. Beebe, Laura B. Picraux, Roger D van Zee, D R. Stewart, M Ratner, James G. Kushmerick
Abstract: Using inelastic electron tunneling spectroscopy (IETS) to measure the vibronic structure of non-equilibrium molecular transport, aided by a quantitative interpretation scheme based on non-equilibrium Greens function/density functional theory methods, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831436

10. Transition From Direct Tunneling to Field Emission in Metal-Molecule-Metal Junctions
Published: 7/1/2006
Authors: J M. Beebe, BongSoo Kim, John William Gadzuk, C D Frisbie, James G. Kushmerick
Abstract: Current-voltage measurements of metal-molecule-metal tunnel junctions formed from p-conjugated thiols exhibit an inflection point on a plot of ln(I/V2) against 1/V, consistent with a transition in tunneling barrier shape from trapezoidal to triangula ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830974



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series