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Author: david kuhn

Displaying records 21 to 30 of 96 records.
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21. Efficient Algorithms for T-way Test Sequence Generation
Published: 10/16/2012
Authors: Linbin Yu, Yu Lei, Raghu N Kacker, David R Kuhn, James F Lawrence
Abstract: Combinatorial testing has been shown to be a very effective testing strategy. Most work on combinatorial testing focuses on t-way test data generation, where each test is an unordered set of parameter values. In this paper, we study the problem of t- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911348

22. Efficient Methods for Interoperability Testing Using Event Sequences
Published: 7/31/2012
Authors: David R Kuhn, James M. Higdon, J .M. Lawrence, Raghu N Kacker, Yu Lei
Abstract: Many software testing problems involve sequences of events. The methods described in this paper were motivated by testing needs of mission critical systems that may accept multiple communication or sensor inputs and generate output to several commun ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909665

23. Combinatorial Testing
Published: 6/25/2012
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Combinatorial testing is a method that can reduce cost and improve test effectiveness significantly for many applications. The key insight underlying this form of testing is that not every parameter contributes to every failure, and empirical data su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910001

24. Evaluation of Fault Detection Effectiveness for Combinatorial and Exhaustive Selection of Discretized Test Inputs
Published: 6/4/2012
Authors: Carmelo Montanez-Rivera, David R Kuhn, Mary C Brady, Richard M Rivello, Jenise Reyes Rodriguez, Michael K. Powers
Abstract: Testing components of web browsers and other graphical interface software can be extremely expensive because of the need for human review of screen appearance and interactive behavior. Combinatorial testing has been advocated as a method that provid ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909661

25. Combinatorial Methods for Event Sequence Testing
Published: 4/17/2012
Authors: David R Kuhn, James M. Higdon, James F Lawrence, Raghu N Kacker, Yu Lei
Abstract: Many software testing problems involve sequences. This paper presents an application of combinatorial methods to testing problems for which it is important to test multiple configurations, but also to test the order in which events occur. For exam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906770

26. Vulnerability Hierarchies in Access Control Configurations
Published: 12/27/2011
Author: David R Kuhn
Abstract: This paper applies methods for analyzing fault hierarchies to the analysis of relationships among vulnerabilities in misconfigured access control rule structures. Hierarchies have been discovered previously for faults in arbitrary logic formulae, s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909742

27. Role Engineering: Methods and Standards
Published: 12/8/2011
Authors: Edward Coyne, Timothy Weil, David R Kuhn
Abstract: This article explains problems and approaches to designing permission structures for role based access control. RBAC and the RBAC standard are summarized, common approaches to role engineering described, and the current status and plans for the INCI ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909664

28. Vetting Mobile Apps
Published: 7/22/2011
Authors: Stephen Quirolgico, Jeffrey Mark Voas, David R Kuhn
Abstract: Billions of copies of apps for mobile devices have been purchased in recent years. With this growth, however, comes an increase in the spread of potentially dangerous security vulnerabilities. Because of an app's low cost and high proliferation, the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908762

29. A Combinatorial Approach to Detecting Buffer Overflow Vulnerabilities
Published: 6/14/2011
Authors: Raghu N Kacker, Yu Lei, David R Kuhn, Wenhua Wang
Abstract: Buffer overflow vulnerabilities are program defects that can cause a buffer overflow to occur at runtime. Many security attacks exploit buffer overflow vulnerabilities to compromise critical data structures. In this paper, we present a black-box test ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905210

30. A Survey of Binary Covering Arrays
Published: 4/7/2011
Authors: James F Lawrence, Raghu N Kacker, David R Kuhn, Michael Forbes
Abstract: Two-valued covering arrays of strength t are 0--1 matrices having the property that for each t columns and each of the possible 2t sequences of t 0's and 1's, there exists a row having that sequence in that set of t columns. Covering arrays are an im ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51256



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