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You searched on: Author: david kuhn

Displaying records 21 to 30 of 107 records.
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21. A General Conformance Testing Framework for IEEE 11073 PHD's Communication Model
Published: 5/31/2013
Authors: Raghu N Kacker, Linbin Yu, Yu Lei, David R Kuhn, Ram D Sriram, Kevin G Brady
Abstract: ISO/IEEE 11073 Personal Health Data (IEEE 11073 PHD) is a set of standards that addresses the interoperability of personal healthcare devices. As an important part of IEEE 11073 PHD, ISO/IEEE 1107-20601 optimized exchange protocol (IEEE 11073-20601) ...

22. An Input Space Modeling Methodology for Combinatorial Testing
Published: 3/22/2013
Authors: Mehra N. Borazjany, Laleh Ghandehari, Yu Lei, Raghu N Kacker, David R Kuhn
Abstract: The input space of a system must be modeled before combinatorial testing can be applied to this system. The effectiveness of combinatorial testing to a large extent depends on the quality of the input space model. In this paper we introduce an input ...

23. Applying Combinatorial Testing to the Siemens Suite
Published: 3/22/2013
Authors: Laleh Ghandehari, Mehra N. Borazjany, Yu Lei, Raghu N Kacker, David R Kuhn
Abstract: Combinatorial testing has attracted a lot of attention from both industry and academia. A number of reports suggest that combinatorial testing can be effective for practical applications. However, there still seems to lack systematic, controlled stud ...

24. Combinatorial Coverage Measurement Concepts and Applications
Published: 3/22/2013
Authors: David R Kuhn, Itzel (Itzel) Dominquez Mendoza, Raghu N Kacker, Yu Lei
Abstract: Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of meas ...

25. Protecting Wireless Local Area Networks
Published: 12/3/2012
Authors: Shirley M. Radack, David R Kuhn
Abstract: This article summarizes the information that was presented in the February 2012 Information Technology Laboratory (ITL) bulletin, Guidelines for Securing Wireless Local Area Networks (WLANs). The bulletin, which was noted by WERB in February 2012, wa ...

26. Combinatorial Coverage Measurement
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7878
Published: 10/26/2012
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Combinatorial testing applies factor covering arrays to test all t-way combinations of input or configuration state space. In some testing situations, it is not practical to use covering arrays, but any set of tests covers at least some portion ...

27. Efficient Algorithms for T-way Test Sequence Generation
Published: 10/16/2012
Authors: Linbin Yu, Yu Lei, Raghu N Kacker, David R Kuhn, James F Lawrence
Abstract: Combinatorial testing has been shown to be a very effective testing strategy. Most work on combinatorial testing focuses on t-way test data generation, where each test is an unordered set of parameter values. In this paper, we study the problem of t- ...

28. Measuring Combinatorial Coverage of System State-space for IV&V
Published: 9/13/2012
Authors: David R Kuhn, Raghu N Kacker
Abstract: This report describes some measures of combinatorial coverage that can be helpful in estimating this risk that we have applied to tests for spacecraft software but have general application to any combinatorial coverage problem. This method will be i ...

29. Efficient Methods for Interoperability Testing Using Event Sequences
Published: 7/31/2012
Authors: David R Kuhn, James M. Higdon, J .M. Lawrence, Raghu N Kacker, Yu Lei
Abstract: Many software testing problems involve sequences of events. The methods described in this paper were motivated by testing needs of mission critical systems that may accept multiple communication or sensor inputs and generate output to several commun ...

30. Combinatorial Testing
Published: 6/25/2012
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Combinatorial testing is a method that can reduce cost and improve test effectiveness significantly for many applications. The key insight underlying this form of testing is that not every parameter contributes to every failure, and empirical data su ...

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