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Author: john kramar
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1. Dependency of Morphology on Miscut Angle for Si(111) Etched in NH^d4^F
Published: 5/1/2003
Authors: Joseph Fu, Hui Zhou, John A Kramar, Richard M Silver, S Gonda
Abstract: Using scanning probe microscopy, we have examined the surfaces produced by etching several different vicinal Si(111) samples in NH^d4^F aqueous solution. In agreement with others, we found that deoxygenation of the etchant generally reduces the numbe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823151

2. A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE
Published: 10/19/2008
Authors: Jing Li, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, John A Kramar
Abstract: A compact, two-stage, vertical actuator with built-in sensors has been developed for the Molecular Measuring Machine (M3) and other potential precision instrumentation applications, such as scanning probe microscopy (SPM). In this article, we descri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824698

3. A Flexure Balance With Adjustable Restoring Torque for Nanonewton Force Measurement
Published: 1/1/2002
Authors: Jon Robert Pratt, David B Newell, John A Kramar
Abstract: The NIST electrostatic force balance compares mechanical probe forces to an SI realization of force derived from measurements of the capacitance gradient and voltage in an electronic null balance. As we approach the nanonewton regime, the finite stif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822422

4. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

5. Active Vibration Isolation for a Long-Range Scanning Tunneling Microscope
Published: 6/1/2004
Authors: K J Lan, J Y Yen, John A Kramar
Abstract: Vibration Isolation or control is critical for the optimum operation of the Molecular Measuring Machine (M3), a high-resolution, length-metrology instrument at the National Institute of Standards and Technology. This paper describes the extension of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822400

6. Active Vibration Isolation of a Large Stroke Scanning Probe Microscope by Using Discrete Sliding Mode Control
Published: 5/31/2005
Authors: J Y Yen, K J Lan, John A Kramar
Abstract: Active vibration isolation is gaining increased attention in the ultra high precision applications to effectively treat the unavoidable ground vibration. The use of active vibration isolation is now being explored for the Molecular Measuring Machine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822381

7. Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method
Series: Journal of Research (NIST JRES)
Published: 7/1/2011
Authors: Richard Swift Gates, Mark Reitsma, John A Kramar, Jon Robert Pratt
Abstract: The evolution of the atomic force microscope into a useful tool for measuring mechanical properties of surfaces at the nanoscale has spurred the need for more precise and accurate methods for calibrating the spring constants of test cantilevers. Gro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906987

8. Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement
Published: 1/1/2006
Authors: Gordon Allan Shaw, Jon Robert Pratt, John A Kramar
Abstract: A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic force microscope (AFM) or other device. The procedure utilizes dynamic force instrumented i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821950

9. Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance
Published: 11/16/2003
Authors: Jon Robert Pratt, David B Newell, John A Kramar, Eric Paul Whitenton
Abstract: The characterization of material properties and mechanical performance of micro-electromechanical devices often hinges on the accurate measurement of small forces.  Calibrated load cells of appropriate size and range are used, but are often not ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823316

10. Comparison of NIST SI Force Scale to NPL SI Mass Scale
Published: 10/19/2008
Authors: Christopher W. Jones, John A Kramar, Stuart Davidson, Richard Leach, Jon Robert Pratt
Abstract: Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at Gaithersburg and used as deadweights on the NIST electrostatic force balance, to facilitate a mass- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824727



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