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Author: jason killgore

Displaying records 11 to 16.
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11. Pulsed Contact Resonance in the Atomic Force Microscope
Published: 1/30/2012
Authors: Jason Philip Killgore, Donna C. Hurley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910331

12. Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy
Published: 1/11/2012
Authors: Jason Philip Killgore, Donna C. Hurley
Abstract: Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the hundreds of nanonewton to few micronewton range. Such large forces can incur sa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909735

13. Effect of elastic deformation on frictional properties of few-layer graphene
Published: 1/9/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore, Vinod K Tewary
Abstract: We describe the results of Brownian dynamics (BD) simulations of an AFM tip scanned on locally suspended few-layer graphene. The effects of surface compliance and sample relaxation are directly related to the observed friction force. We demonstrate t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909404

14. Viscoelastic Property Mapping with Contact Resonance Force Microscopy
Published: 11/4/2011
Authors: Jason Philip Killgore, Donna C. Hurley, Dalia Yablon, Joseph Turner, Philip Yuya, Roger Proksch, Anil Gannepalli, Andy Tsou
Abstract: We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonanc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909102

15. Quantitative Subsurface Contact Resonance Force Microscopy of Model Polymer Nanocomposites
Published: 3/16/2011
Authors: Jason Philip Killgore, Jennifer Y. Kelly, Christopher M Stafford, Michael J Fasolka, Donna C. Hurley
Abstract: We present experimental results on the use of quantitative contact resonance force microscopy (CR-FM) for mapping the planar location and depth of 50 nm silica nanoparticles buried beneath polystyrene films 30 nm to 165 nm thick. The presence of sha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907026

16. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy Howard Geiss, Donna C. Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907208



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