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Author: simon kaplan
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1. 40 Years of Metrology With Synchrotron Radiation at SURF
Published: 9/1/2003
Authors: Uwe Arp, Steven E Grantham, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: the advantages of a compact synchrotron radiation source like the Synchrotron Ultraviolet Radiation Facility for metrology in the ultraviolet and extreme ultraviolet are shown. The capabilities of the different experimental stations are explained an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840164

2. Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements
Published: 10/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a hi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841483

3. Angle-dependent absolute infrared reflectance and transmittance measurements
Published: 1/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103914

4. Angle-dependent infrared reflectance measurements in support of VIIRS
Published: 8/14/2008
Authors: Simon Grant Kaplan, Leonard M Hanssen, Enrique J. Iglesias
Abstract: We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 um to 20 um wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842529

5. Broadband Emissivity Calibration of Highly Reflective Samples at Cryogenic Temperatures
Published: 10/15/2012
Authors: Solomon I Woods, Timothy M. Jung, Greg Ly, Simon Grant Kaplan, Jie Yu
Abstract: We have developed a technique for calibrating the broadband optical emissivity of high reflectivity samples at cryogenic temperatures. This measurement method employs a primary standard optical detector with high absorptance from visible wavelengths ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911439

6. Calibration and Deployment of a New NIST Transfer Radiometer for Broadband and Spectral Calibration of Space Chambers (MDXR)
Published: 9/30/2011
Authors: Timothy M. Jung, Adriaan C. Carter, Solomon I Woods, Simon Grant Kaplan
Abstract: The Low-Background Infrared (LBIR) facility at NIST has performed on-site calibration and initial off-site deployments of a new infrared transfer radiometer with an integrated cryogenic Fourier transform spectrometer (Cryo-FTS). This mobile radi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908521

7. Calibration of IR Test Chambers with the Missile Defense Transfer Radiometer
Published: 9/30/2013
Authors: Simon Grant Kaplan, Solomon I Woods, Adriaan Carl Linus Carter, Timothy Michael Jung
Abstract: The Missile Defense Transfer Radiometer (MDXR) is designed to calibrate infrared collimated and flood sources over the fW/cm2 to W/cm2 power range from 3 m to 28 m in wavelength. The MDXR operates in three different modes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913741

8. Calibration of Ultra-Low Infrared Power at NIST
Published: 7/20/2010
Authors: Solomon I Woods, Stephen M. Carr, Adriaan C. Carter, Timothy M. Jung, Simon Grant Kaplan, Raju Vsnu Datla
Abstract: The Low Background Infrared (LBIR) facility has developed and tested the components of a new detector for calibration of infrared powers down to 1 pW, with 0.1% uncertainty. Calibration of such low powers could be valuable for the quantitative study ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906008

9. Characterization of High-OD Ultrathin Infrared Neutral Density Filters
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen, Alan L Migdall, G Lefever-Button
Abstract: We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, fre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841303

10. Characterization of Narrow-Band Infrared Interference Filters
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier-transform infrared (FT-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an f/4 beam geometry at no ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841309



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