NIST logo

Publications Portal

You searched on: Author: edwin heilweil Sorted by: title

Displaying records 1 to 10 of 98 records.
Resort by: Date / Title


1. A Dual Beam Sub-picosecond Broadband Infrared Spectrometer
Published: 1/1/1994
Authors: T P Dougherty, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104405

2. A SMALL-SAMPLE, BI-DIRECTIONAL SCATTERING MEASUREMENT SYSTEM FROM 200-500 GHz
Published: 10/26/2012
Authors: David R Novotny, Joshua A Gordon, Edwin J Heilweil, Brian C. Stillwell, Jeffrey R Guerrieri, Erich N Grossman, Shu Zee A. Lo
Abstract: Beginning the fall of 2012, NIST will be providing scattering measurements for other government agencies. We present performance results of a bi-directional scattering measurement system in the 200-500 GHz range. The goal is to provide dense-spectru ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911923

3. An infrared imaging high-throughput combinatorial method for investigating new phase formation and hydrogen storage capacities of thin films
Published: 7/15/2009
Authors: Jason Hattrick-Simpers, Leonid A Bendersky, Edwin J Heilweil, H. Oguchi, Ichiro Takeuchi
Abstract: We have refined and expanded on the capabilities of rapid screening, which utilizes infrared (IR) emissivity imaging. A complete procedure for using infrared emissivity to characterize the hydrogen storage properties of thin-film samples is describ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901373

4. Application of nanoporous silicon substrates for terahertz spectroscopy
Published: 12/20/2012
Authors: Edwin J Heilweil, Shu-Zee A. Lo, Gagan Kumar, Thomas E. Murphy
Abstract: Infrared spectroscopy is a valuable tool for probing and characterizing the macro-molecular motions of complex molecules, including vibrational and phonon modes that cannot be easily accessed through visible spectroscopy. We describe here an impro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912179

5. Applications of Broadband Transient Infrared Spectroscopy, ed. by M.D. Fayer
Published: 1/1/2001
Author: Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104527

6. Applications of THz Spectroscopy in Biosystems
Published: 1/1/2007
Authors: David F Plusquellic, Karen M. Siegrist, Edwin J Heilweil, Okan Esenturk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101773

7. Applications of Ultrafast Transient Infrared Spectroscopies
Published: 5/1/2002
Authors: T Heimer, Edwin J Heilweil
Abstract: Modern techniques for performing ultrafast transient mid-infrared spectroscopy using turnable, broadband infrared probe pulses with multi-channel CCD and infrared focal plane array detection is presented. Novel application of these picosecond and fem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841414

8. Applications of Ultrafast Transient Infrared Spectroscopies, ed. by H. Hamaguchi
Published: 1/1/2002
Authors: T Heimer, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104530

9. Bimolecular Interactions in (Et)^d3^SiOH: Base:CCl^d4^ Hydrogen-Bonded Solutions Studied by Deactivation of the "Free" OH-Stretch Vibration
Published: 1/1/1995
Authors: W T Grubbs, T P Dougherty, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103829

10. Broadband Femtosecond Transient Infrared Spectroscopy using a 256 {?}256 InSb Focal-Plane Detector
Published: 1/1/1997
Authors: S M Arrivo, V D Kleiman, T P Dougherty, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101029



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series