NIST logo

Publications Portal

You searched on:
Author: edwin heilweil
Sorted by: title

Displaying records 1 to 10 of 77 records.
Resort by: Date / Title


1. A Dual Beam Sub-picosecond Broadband Infrared Spectrometer
Published: 1/1/1994
Authors: T P Dougherty, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104405

2. Applications of Broadband Transient Infrared Spectroscopy, ed. by M.D. Fayer
Published: 1/1/2001
Author: Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104527

3. Applications of THz Spectroscopy in Biosystems
Published: 1/1/2007
Authors: David F Plusquellic, Karen M. Siegrist, Edwin J Heilweil, Okan Esenturk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101773

4. Applications of Ultrafast Transient Infrared Spectroscopies
Published: 5/1/2002
Authors: T Heimer, Edwin J Heilweil
Abstract: Modern techniques for performing ultrafast transient mid-infrared spectroscopy using turnable, broadband infrared probe pulses with multi-channel CCD and infrared focal plane array detection is presented. Novel application of these picosecond and fem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841414

5. Applications of Ultrafast Transient Infrared Spectroscopies, ed. by H. Hamaguchi
Published: 1/1/2002
Authors: T Heimer, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104530

6. Bimolecular Interactions in (Et)^d3^SiOH: Base:CCl^d4^ Hydrogen-Bonded Solutions Studied by Deactivation of the "Free" OH-Stretch Vibration
Published: 1/1/1995
Authors: W T Grubbs, T P Dougherty, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103829

7. Broadband Femtosecond Transient Infrared Spectroscopy using a 256 {?}256 InSb Focal-Plane Detector
Published: 1/1/1997
Authors: S M Arrivo, V D Kleiman, T P Dougherty, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101029

8. Broadband Transient IR Spectroscopy of Metal Carbonyl Photochemistry
Published: 1/1/1994
Authors: Edwin J Heilweil, T P Dougherty
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100904

9. Characterization of Metal-Oxide Nanofilm Morphologies and Composition by Terahertz Transmission Spectroscopy
Published: 3/30/2009
Authors: Edwin J Heilweil, James E Maslar, William Andrew Kimes, Nabil Bassim, Peter K. Schenck
Abstract: An all-optical terahertz absorption technique for non-destructive characterization of nanometer-scale metal-oxide thin films grown on silicon substrates is described. Example measurements of laser and atomic layer-deposited films of HfO2, TiO3, Al2O ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842590

10. Comparative OHD-RIKES and THz-TDS Probes of Ultrafast Structural Dynamics in Molecular Liquids
Published: 10/1/2004
Authors: M C Beard, W T Lotshaw, T M Korter, Edwin J Heilweil, D McMorrow
Abstract: We compare terahertz time-domain (THz-TDS) and optical heterodyne detected Raman-induced Kerr effect (OHD-RIKES) spectroscopic techniques as probes of molecular and vibrational dynamics in the frequency range 0.1 THz to 6 THz (3 cm-1 to 200 cm-1). T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841814



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series