NIST logo

Publications Portal

You searched on:
Author: leonard hanssen

Displaying records 141 to 150 of 162 records.
Resort by: Date / Title


141. Effective Emissivity of a Cylindrical Cavity with an Inclined Bottom: I. Isothermal Cavity
Published: Date unknown
Authors: Leonard M Hanssen, A Prokhorov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841836

142. FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer-based broadband infrared ellipsometer has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841399

143. FT-IR Based Polarimeter with High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer based broadband infrared polarimeter has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841753

144. IR Spectral Characterization of Customer Blackbody Sources: First Calibration Results
Published: Date unknown
Authors: Sergey Mekhontsev, Mart Noorma, A Prokhorov, Leonard M Hanssen
Abstract: We summarize recent progress in our infrared (IR) spectral radiance metrology effort. In support of customer blackbody characterization, a realization of the spectral radiance scale has been undertaken in the temperature range of 232 C to 962 C and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841007

145. Infrared Diffuse Reflectance Instrumentation and Standards at NIST
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its capabilities include the measurement of directional-hemispherical reflectance from 1 *m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841308

146. Infrared Optical Property Characterization in the Optical Technology Division
Published: Date unknown
Author: Leonard M Hanssen
Abstract: Accurate non-contact thermometry requires accurate knowledge of the opticla properties of the materials under test. Radiometric measurements of a sample at any given temperature will include reflected (and transmitted) light originating from the surr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841514

147. Methods for Absolute Reflectance Measurement of Transmissive Materials in the Infrared
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the V-W , V-N , and goniometer based methods, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841311

148. Methods for Evaluation of Transmittance Minima in Wavenumber Standards Spectra: A Comparison and Analysis
Published: Date unknown
Authors: Leonard M Hanssen, C. J. Zhu
Abstract: The final two elements in the process of wavenumber calibration of a spectrometer involve software processing. These are (a) the generation of a spectrum through the Fourier transform processing of the measured interferogram (for Fourier transform s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841637

149. Miniature Fourier Transform Instrument for Radiation Thermometry
Published: Date unknown
Authors: F J Dunmore, Leonard M Hanssen
Abstract: A miniature Fouier transform (FT0 spectrometer was evaluated as a device for remotely measuring the temperature of a high stability/emissivity blackbody. The device, commercially manufactured by Photonex LTD.,* is based on the novel design of a pola ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841988

150. NIST Program for the Infrared Emittance Characterization of Materials for Thermal Conductivity29/Thermal Expansion 17
Published: Date unknown
Authors: Leonard M Hanssen, Sergey Mekhontsev, Simon Grant Kaplan
Abstract: Over the past decade and a half, the National Institute of Standards and Technology (NIST) has established measurement capabilities for the characterization of the spectral emittance of material samples in the infrared spectral range of 1 to 20 micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841102



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series