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You searched on: Author: william guthrie

Displaying records 21 to 30 of 85 records.
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21. Interlaboratory Comparisons
Published: 12/10/2007
Author: William F Guthrie
Abstract: An interlaboratory comparison for a measurement procedure is an exercise carried out by a group of laboratories to compare their performance or assess a measurement standard. Interlaboratory comparisons are typically used for one of three main purpos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51102

22. Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers
Published: 11/1/2007
Authors: Robert G Downing, David S Simons, George Paul Lamaze, Richard Mark Lindstrom, Robert Russ Greenberg, Rick L Paul, Susannah B. Schiller, William F Guthrie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904275

23. Effect of Static Analysis Tools on Software Security: Preliminary Investigation
Published: 10/29/2007
Authors: Vadim Okun, William F Guthrie, Romain Gaucher, Paul E Black
Abstract: Static analysis tools can handle large-scale software and find thousands of defects. But do they improve software security? We evaluate the effect of static analysis tool use on software security in open source projects. We measure security by vulner ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51237

24. Single Crystal Critical Dimension Reference Materials (SCCDRM): Process Optimization for the Next Generation of Standards
Published: 4/5/2007
Authors: Ronald G Dixson, William F Guthrie, Michael W. Cresswell, Richard A Allen, Ndubuisi George Orji
Abstract: Critical dimension atomic force microscopes (CD-AFMs) are rapidly gaining acceptance in semiconductor manufacturing metrology.  These instruments offer non-destructive three dimensional imaging of structures and can provide a valuable complement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823219

25. Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers
Published: 1/1/2007
Authors: David S Simons, Robert G Downing, George Paul Lamaze, Richard Mark Lindstrom, Robert Russ Greenberg, Rick L Paul, Susannah Schiller, William F Guthrie
Abstract: Certified reference materials have been developed for calibration of the concentrations of the most common dopants used in silicon semiconductor technology boron, arsenic, and phosphorus. These materials consist of a single dopant species that is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831437

26. Calcium Phosphate Cement With Non-Rigidity and Strength Durability for Periodontal Bone Repair
Published: 8/1/2006
Authors: Hockin D. Xu, Shozo Takagi, Limin Sun, L A Hussain, Laurence Chung Lung Chow, William F Guthrie, James H Yen
Abstract: Background. The need for biomaterials to treat periodontal osseous defects has increased as the world population ages. The objective of the present study was to develop a self-hardening, resorbable, and mech/anically strong calcium phosphate cement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852519

27. Certification of SRM 114q: Part I
Series: Special Publication (NIST SP)
Report Number: 260-161
Published: 6/14/2006
Authors: Chiara F Ferraris, William F Guthrie, A Aviles, Robin K Haupt, Bruce S MacDonald
Abstract: The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to qualify cements. Being a powder, the main physical properties of cement, prior to hydratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860624

28. Certification of SRM 114q: Part II
Series: Special Publication (NIST SP)
Report Number: 260-166
Published: 6/14/2006
Authors: Chiara F Ferraris, Max A Peltz, William F Guthrie, A Aviles, Robin K Haupt, Bruce S MacDonald
Abstract: The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to qualify cements. Being a powder, the main physical properties of cement, prior to hydratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860657

29. k=2 and Other Sometimes Hidden Assumptions in Chemical Measurement Uncertainty Intervals
Published: 4/24/2006
Authors: David Lee Duewer, S LR Ellison, William F Guthrie, D B Hibbert, C Jackson, A Kallner, Stefan D Leigh, Reenie May Parris, Kenneth W Pratt, Michele M Schantz, Katherine E Sharpless
Abstract: A recent interlaboratory study that required individual analysts to estimate uncertainty intervals for their results revealed that some experienced chemical analysts have difficulty with measurement uncertainty calculations. To help validate assumpti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832153

30. Traceable Atomic Force Microscope Dimensional Metrology at NIST
Published: 3/1/2006
Authors: Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Michael W. Cresswell, Richard A Allen, William F Guthrie
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology.  There are two major instruments being used for traceable measurements at NIST.  The first is a cus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823204



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