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Author: john gillen
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81. Secondary Ion Mass Spectrometry Isotope Ration Data of Uranium Oxide Particles and Detection of Groupings
Albert J. Fahey, John G Gillen
Secondary ion mass spectrometry (SIMS) has been used in an automated way to survey a large number of particles to find isotopically rare materials and characterize isotopically distinct populations. One application of this method is the detection ...
82. The Use of an SF5+ Primary Ion Beam for Ultra Shallow Depth Profiling on an Ion Microscope SIMS Instrument
John G Gillen, Marlon L Walker, P E Thompson, J Bennett
A magnetic sector SIMS instrument has been fitted with a modified hot filament duoplasmatron ion source for generation of SF^d5^^u+^ primary ion beams for SIMS depth profiling applications. The SF^d5^^u+^ primary ion beam has been evaluated by depth ...
83. Trace Explosive Detection Standards Using Drop-on-Demand Inkjet Printing Technology
Eric S Windsor, Bruce A Benner Jr, Robert A Fletcher, John G Gillen, R Lareau, Inho Cho, Mike Boldmand
A piezoelectric drop-on-demand inkjet printer system has been used to prepare prototype trace explosive calibration materials to aid in the performance evaluation of ion mobility spectrometry instruments that are now widely deployed in support of hom ...