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Author: john gillen

Displaying records 81 to 84.
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81. Raman Microspectroscopy of Some High Explosives, Revisited
Published: Date unknown
Authors: E S. Etz, S V. Roberson, John G Gillen
Abstract: Current NIST research is discussed on the characterization by micro-Raman spectroscopy of several high explosives (HES). The RamanSpectra are evaluated relative to the thermal decomposition of the HES to explain the reactions that produce secondary ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831282

82. Secondary Ion Mass Spectrometry Isotope Ration Data of Uranium Oxide Particles and Detection of Groupings
Published: Date unknown
Authors: Albert J. Fahey, John G Gillen
Abstract: Secondary ion mass spectrometry (SIMS) has been used in an automated way to survey a large number of particles to find isotopically rare materials and characterize isotopically distinct populations[1]. One application of this method is the detection ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831228

83. The Use of an SF5+ Primary Ion Beam for Ultra Shallow Depth Profiling on an Ion Microscope SIMS Instrument
Published: Date unknown
Authors: John G Gillen, Marlon L Walker, P E Thompson, J Bennett
Abstract: A magnetic sector SIMS instrument has been fitted with a modified hot filament duoplasmatron ion source for generation of SF^d5^^u+^ primary ion beams for SIMS depth profiling applications. The SF^d5^^u+^ primary ion beam has been evaluated by depth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831115

84. Trace Explosive Detection Standards Using Drop-on-Demand Inkjet Printing Technology
Published: Date unknown
Authors: Eric S Windsor, Bruce A Benner Jr, Robert A Fletcher, John G Gillen, R Lareau, Inho Cho, Mike Boldmand
Abstract: A piezoelectric drop-on-demand inkjet printer system has been used to prepare prototype trace explosive calibration materials to aid in the performance evaluation of ion mobility spectrometry instruments that are now widely deployed in support of hom ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831434



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