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Author: john gillen

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31. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901923

32. Characterization of High Explosive Particles Using Cluster Secondary Ion Mass Spectrometry
Published: 1/1/2006
Authors: John G Gillen, Scott A Wight, Christine M. Mahoney, Richard T. Lareau
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901035

33. IMS-Based Trace Explosives Detectors for First Responder Use
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7240
Published: 9/1/2005
Authors: Jennifer R Verkouteren, John G Gillen, R Michael Verkouteren, Robert A Fletcher, E S. Etz, George A Klouda, Alim A Fatah, P Mattson
Abstract: The purpose of this document is to establish minimum performance requirements and an associated test method for Ion Mobility Spectrometry (IMS) based trace explosives detectors for use by the first responder community. Information concerning the the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831386

34. Automated Analysis of Organic Particles Using Cluster SIMS
Published: 6/1/2004
Authors: John G Gillen, Cynthia J Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A Fletcher, P Chi, Jennifer R Verkouteren, David S. Bright, R Lareau, M Boldman
Abstract: Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831316

35. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The feasibility of cluster Secondary Ion Mass Spectrometry (SIMS) for depth profiling of drug delivery systems is explored. Behaviors of various biodegradable polymer films under dynamic SF^d5^^u+^ primary ion bombardment was investigated including s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831329

36. Dynamic SIMS Utilizing SF^d5^^u+^ Polyatomic Primary Ion Beams for Drug Delivery Applications
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The behavior of various biodegradable polymer films (e.g. polylactic acid, polyglycolic acid and polycaprolactone) as well as some model drugs (theophylline and 4-acetamidophenol) under dynamic SF^d5^^u+^ primary ion bombardment is explored. A serie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831312

37. Positive Secondary Ion Yield Enhancement of Metal Elements Using Trichlorotrifluoroethane and Tetrachloroethene Backfilling
Published: 6/1/2004
Authors: P Chi, John G Gillen
Abstract: Positive secondary ion yields are strongly enhanced by the presence of reactive gas species. Oxygen primary ion bombardment or oxygen backfilling is commonly used for this purpose. However, for some weak oxide forming metal elements such as Nb, Mo, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831326

38. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831302

39. Thermolithographic Patterning of Sol-Gel Metal Oxides on Micro hot plate Sensing Arrays Using Organosilanes
Published: 9/1/2003
Authors: N O. Savage, S V. Roberson, John G Gillen, Michael J Tarlov, Stephen Semancik
Abstract: Sol-gel derived SnO2 and Fe2O3 were selectively deposited on elements of microhotplate (?HP) arrays. The silicon micromachined ?HP arrays contain heating elements (100 ?m x 100 ?m) that are electronically addressable and thermally isolated from each ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830796

40. Raman Microspectroscopy of some High Explosives heated to High Temperatures
Published: 8/1/2003
Authors: E S. Etz, S V. Roberson, John G Gillen
Abstract: Paper reports on the micro-Raman spectra of several high explosives heated to high temperatures, up to melting point. These spectroscopic results are correlated with the degradation and decomposition of these energetic materials.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831289