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You searched on: Author: john gillen

Displaying records 31 to 40 of 87 records.
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31. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...

32. Fundamentals and Applications of Cluster SIMS
Published: 1/1/2007
Authors: Christopher W Szakal, John G Gillen

33. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt-Co Alloy Multilayer by SIMS Using a Buckministerfullerene (C^d60^)
Published: 1/1/2007
Authors: K J Kim, David S Simons, John G Gillen
Abstract: A Buckminsterfullerene ion beam has been applied to the depth profiling of an alternating pure Pt and pure Co multilayer. Quantitative depth profiling was performed by secondary ion mass spectrometry (SIMS) with C60 ions using Pt-Co alloy films with ...

34. Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS
Published: 1/1/2007
Authors: K J Kim, D Moon, C J Park, David S Simons, John G Gillen, H Jin, H Kang
Abstract: Quantitative surface analysis of Fe-Ni alloy thin films has been proposed as a new subject for a pilot study by the surface analysis working group of the Consultative Committee for Amount of Substance (CCQM). Three Fe-Ni alloy films with different ...

35. Characterization and Ion-Induced Degradation of Cross-Linked Poly(Methyl Methacylate) Studies Using Time of Flight Secondary Ion Mass Spectrometry
Published: 12/30/2006
Authors: M S. Wagner, K Lenghaus, John G Gillen, Michael J Tarlov
Abstract: In this study, a series of random copolymers of methyl methacrylate (MMA) and ethylene glycol dimethacrylate (EGDMA) were prepared as surface-initiated polymer (SIP) films on silicon substrates using atom transfer radical polymerization. Positive and ...

36. Piezoelectric Trace Vapor Calibrator
Published: 8/1/2006
Authors: R Michael Verkouteren, John G Gillen, David Taylor
Abstract: The design and performance of a vapor generator for calibration and testing of trace chemical sensors are described. The device utilizes piezoelectric nozzles to dispense and vaporize precisely known amounts of analytic solutions onto a hot ceramic s ...

37. 3D Molecular Imaging SIMS
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...

38. Performance of a C^d60^+ Ion Source on a Dynamic SIMS Instrument
Published: 7/1/2006
Authors: Albert J. Fahey, John G Gillen, P Chi, Christine M. Mahoney
Abstract: An IonOptika [1] C60+ ion source has been fitted onto a CAMECA [1] ims-4f. Stable ion beams of C60+ and C602+ have been obtained with typical currents approaching 20 nA under conditions that allow for several days of source operation. The beam has ...

39. Temperature-Controlled Depth Profiling in Polymeric Biomaterials Using Cluster Secondary Ion Mass Spectrometry
Published: 7/1/2006
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, J Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile through various polymeric biomaterials at a series of temperatures from -125 oC to 150 oC. The depth profile characteristics (e.g. inte ...

40. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey

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