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Author: john gillen

Displaying records 21 to 30 of 84 records.
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21. NIST Program to Support Testing and Evaluation of Trace Explosive Detection
Published: 10/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, Wayne Smith
Abstract: Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831432

22. Inkjet Metrology and Standards for Ion Mobility Spectrometry
Published: 9/1/2007
Authors: R Michael Verkouteren, J Brazin, Eric S Windsor, Robert A Fletcher, R Maditz, Wayne Smith, John G Gillen
Abstract: Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference materials, calibration services, and other standards for the IMS detection of trace contraband ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831425

23. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901934

24. Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS
Published: 5/21/2007
Authors: David S Simons, K. J. Kim, John G Gillen, D Moon, H Jin, H Kang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901064

25. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt Co Alloy multilayer by SIMS using a Buckminsterfullerene (C60) Source
Published: 5/15/2007
Authors: Kyung Joong Kim, David S Simons, John G Gillen
Abstract: Buckmins erfullerene ion beam has been applied o he dep h profiling of an al erna ing pure P and pure Co mul ilayer. Quan i a ive dep h profiling was performed by secondary ion mass spec rome ry (SIMS) wi h C60 ions using P Co alloy films wi h di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902088

26. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

27. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

28. Fundamentals and Applications of Cluster SIMS
Published: 1/1/2007
Authors: Christopher W Szakal, John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901023

29. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt-Co Alloy Multilayer by SIMS Using a Buckministerfullerene (C^d60^)
Published: 1/1/2007
Authors: K J Kim, David S Simons, John G Gillen
Abstract: A Buckminsterfullerene ion beam has been applied to the depth profiling of an alternating pure Pt and pure Co multilayer. Quantitative depth profiling was performed by secondary ion mass spectrometry (SIMS) with C60 ions using Pt-Co alloy films with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831431

30. Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS
Published: 1/1/2007
Authors: K J Kim, D Moon, C J Park, David S Simons, John G Gillen, H Jin, H Kang
Abstract: Quantitative surface analysis of Fe-Ni alloy thin films has been proposed as a new subject for a pilot study by the surface analysis working group of the Consultative Committee for Amount of Substance (CCQM). Three Fe-Ni alloy films with different ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831430



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  • SP 250-XX: Calibration Services
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