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You searched on: Author: john gillen

Displaying records 21 to 30 of 87 records.
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21. Method to Determine Collection Efficiency of Particles by Swipe Sampling
Published: 9/1/2008
Authors: Jennifer R Verkouteren, Jessica L Staymates, Robert A Fletcher, Wayne Smith, George A Klouda, John G Gillen
Abstract: A methodology was developed to evaluate particle collection efficiencies from swipe sampling of trace residues. Swipe sampling is used for many applications where trace residues must be collected, including the evaluation of radioactive particle con ...

22. Measurements of Air Jet Induced Release Rates of Spherical Particles from Cloth and Planar Surfaces
Published: 8/11/2008
Authors: Robert A Fletcher, Erin Ferguson, Nathanael Briggs, John G Gillen
Abstract: Experiments were conducted to determine particle release rates from surfaces due to air jet impingement. We utilize monodisperse fluorescent polymer spheres ranging from 1m to 45m diameter distributed on polycarbonate surfaces and muslin cloth. Parti ...

23. Fabrication of Polymer Microsphere Particle Standards Containing Trace Explosives Using an Oil/Water Emulsion Solvent Extraction Piezoelectric Printing Process
Published: 8/1/2008
Authors: Robert A Fletcher, J Brazin, Matthew E Staymates, Bruce A Benner Jr, John G Gillen

24. Polymer Microsphere Particle Standards Containing High Explosives
Published: 1/1/2008
Authors: Matthew E Staymates, Jennifer R Verkouteren, Jessica L Staymates, John G Gillen, Cory Berkland, Robert A Fletcher

25. NIST Program to Support Testing and Evaluation of Trace Explosive Detection
Published: 10/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, Wayne Smith
Abstract: Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and c ...

26. Inkjet Metrology and Standards for Ion Mobility Spectrometry
Published: 9/1/2007
Authors: R Michael Verkouteren, J Brazin, Eric S Windsor, Robert A Fletcher, R Maditz, Wayne Smith, John G Gillen
Abstract: Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference materials, calibration services, and other standards for the IMS detection of trace contraband ...

27. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith

28. Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS
Published: 5/21/2007
Authors: David S Simons, K. J. Kim, John G Gillen, D Moon, H Jin, H Kang

29. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt Co Alloy multilayer by SIMS using a Buckminsterfullerene (C60) Source
Published: 5/15/2007
Authors: Kyung Joong Kim, David S Simons, John G Gillen
Abstract: Buckmins erfullerene ion beam has been applied o he dep h profiling of an al erna ing pure P and pure Co mul ilayer. Quan i a ive dep h profiling was performed by secondary ion mass spec rome ry (SIMS) wi h C60 ions using P Co alloy films wi h di ...

30. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series