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Author: thomas germer

Displaying records 131 to 140 of 164 records.
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131. Multidetector Hemispherical Polarized Light Scattering Instrument, ed. by P.T. Chen, Z.H. Gu, and A.A. Maradudin
Published: 1/1/1999
Author: Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104494

132. Polarization of Light Scattered by Particles on Silicon Wafers
Published: 1/1/1999
Authors: Li Piin Sung, George William Mulholland, Thomas Avery Germer
Abstract: Bidirectional ellipsometry has been developed as a technique for distinguishing among various scattering features near surfaces.Employi Employing incident light with fixed polarization, the technique measures the principal angle of polarization and t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841336

133. Polarization of Light Scattered by Particles on Silicon Wafers, ed. by J.C. Stover
Published: 1/1/1999
Authors: L Sung, G W Mulholland, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104778

134. Polarization of Light Scattered by Spheres on Dielectric Layers on Silicon, ed by P.T. Chen Pages: Z.H. Gu, and A.A. Maradudin
Published: 1/1/1999
Authors: L Sung, G W Mulholland, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104777

135. Polarization of light scattered by microrough surfaces and subsurface defects
Published: 1/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103804

136. Polarized Light Scattering Measurements of Roughness, Subsurface Defects, Particles, and Dielectric Layers on Silicon Wafers, ed. by F. Obelleiro, J.L. Rodr{iacute}guez, and T. Wriedt
Published: 1/1/1999
Authors: Thomas Avery Germer, L Sung
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104496

137. Polarized Light-Scattering Measurements of Dielectric Spheres upon a Silicon Surface
Published: 1/1/1999
Authors: L Sung, G W Mulholland, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104217

138. The Three Components of Reflection
Published: 10/1/1998
Authors: Edward D. Kelley, George R Jones, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11928

139. Polarization of Out-of-Plane Optical Scatter From SiO^d2^ Films Grown on Photolithographically-Generated Microrough Silicon
Published: 7/1/1998
Authors: Thomas Avery Germer, B W Scheer
Abstract: Bi-directional ellipsometry results are presented for scatter from SiO^d2^ films grown on photolithographically produced microrough silicon surfaces. The principle direction of the polarization and the degree of linear polarization for scatter direc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841294

140. Display Reflectance Model Based on the BRDF
Published: 6/1/1998
Authors: Edward D. Kelley, George R Jones, Thomas Avery Germer
Abstract: Many flat panel displays (FPDs) permit anti-reflection surface treatments that differ in character from those of traditional cathode-ray-tube displays. Specular reflection models (mirror-like, producing a distinct image) combined with diffuse (Lambe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24685



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