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Author: thomas germer

Displaying records 121 to 130 of 164 records.
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121. Microroughness-blind Optical Scattering Instrument
Published: 1/1/2000
Author: Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104493

122. Optical Properties of Materials: A Sampling of NIST Contributions
Published: 1/1/2000
Authors: Thomas Avery Germer, R Gupta, Leonard M Hanssen, Eric L Shirley
Abstract: Optics has found an extremely wide range of applications in industry and science, and the properties of the materials that make up optical instruments are key to their performance. Examples include glass for optical instrumentation such as telescopes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841496

123. Polarimetric BRDF in the Microfacet Model: Theory and Measurements
Published: 1/1/2000
Authors: R G Priest, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104720

124. Polarized light scattering measurements of polished and etched steel surfaces, ed. by Z.H. Gu and A.A. Maradudin
Published: 1/1/2000
Authors: Thomas Avery Germer, T Rinder, HT Rothe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104492

125. Multidetector Hemispherical Polarized Optical Scattering Instrument
Published: 7/1/1999
Author: Thomas Avery Germer
Abstract: A multidetector optical scattering instrument is described and characterized. The instrument has twenty-eight detectors surrounding and substantially covering the scattering hemisphere. Each detector contains a polarizer so that each is only sensit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841373

126. Polarized Light Scattering Measurements of Dielectric Spheres upon a Silicon Surface
Published: 7/1/1999
Authors: Li Piin Sung, George William Mulholland, Thomas Avery Germer
Abstract: The polarization of light scattered into directions out of the plane of incidence by polystyrene latex spheres upon a silicon substrate was measured for p-polarized incident light. The experimental data show good agreement with theoretical prediction ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841344

127. Polarized Light Scattering Measurements of Roughness, Subsurface Defects, Particles, and Dielectric Layers on Silcon Wafers
Published: 7/1/1999
Authors: Thomas Avery Germer, Li Piin Sung
Abstract: This article outlines theoretical and experimental results for polarized light scattering from five different sample configurations: surface roughness of a single interface, defects below a single interface, spherical particles above a single surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841371

128. Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements
Published: 6/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
Abstract: A goniometric optical scatter instrument has been developed at the National Institute of Standards and Technology which can readily perform measurements of optical scatter and its associated polarization in directions out of the plane of incidence. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841348

129. Polarization of Light Scattered by Microrough Surfaces and Subsurface Defects
Published: 6/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
Abstract: The polarization of light scattered into directions out of the plane of incidence for 532 nm light incident at 45 with p-polarization was measured from rough silicon, rough titanium nitride, polished fused silica and glass ceramic, and ground and i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841328

130. Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements
Published: 1/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104495



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