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Author: thomas germer

Displaying records 121 to 130 of 159 records.
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121. Polarized Light Scattering Measurements of Dielectric Spheres upon a Silicon Surface
Published: 7/1/1999
Authors: Li Piin Sung, George William Mulholland, Thomas Avery Germer
Abstract: The polarization of light scattered into directions out of the plane of incidence by polystyrene latex spheres upon a silicon substrate was measured for p-polarized incident light. The experimental data show good agreement with theoretical prediction ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841344

122. Polarized Light Scattering Measurements of Roughness, Subsurface Defects, Particles, and Dielectric Layers on Silcon Wafers
Published: 7/1/1999
Authors: Thomas Avery Germer, Li Piin Sung
Abstract: This article outlines theoretical and experimental results for polarized light scattering from five different sample configurations: surface roughness of a single interface, defects below a single interface, spherical particles above a single surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841371

123. Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements
Published: 6/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
Abstract: A goniometric optical scatter instrument has been developed at the National Institute of Standards and Technology which can readily perform measurements of optical scatter and its associated polarization in directions out of the plane of incidence. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841348

124. Polarization of Light Scattered by Microrough Surfaces and Subsurface Defects
Published: 6/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
Abstract: The polarization of light scattered into directions out of the plane of incidence for 532 nm light incident at 45 with p-polarization was measured from rough silicon, rough titanium nitride, polished fused silica and glass ceramic, and ground and i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841328

125. Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements
Published: 1/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104495

126. Multidetector Hemispherical Polarized Light Scattering Instrument, ed. by P.T. Chen, Z.H. Gu, and A.A. Maradudin
Published: 1/1/1999
Author: Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104494

127. Polarization of Light Scattered by Particles on Silicon Wafers
Published: 1/1/1999
Authors: Li Piin Sung, George William Mulholland, Thomas Avery Germer
Abstract: Bidirectional ellipsometry has been developed as a technique for distinguishing among various scattering features near surfaces.Employi Employing incident light with fixed polarization, the technique measures the principal angle of polarization and t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841336

128. Polarization of Light Scattered by Particles on Silicon Wafers, ed. by J.C. Stover
Published: 1/1/1999
Authors: L Sung, G W Mulholland, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104778

129. Polarization of Light Scattered by Spheres on Dielectric Layers on Silicon, ed by P.T. Chen Pages: Z.H. Gu, and A.A. Maradudin
Published: 1/1/1999
Authors: L Sung, G W Mulholland, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104777

130. Polarization of light scattered by microrough surfaces and subsurface defects
Published: 1/1/1999
Authors: Thomas Avery Germer, Clara C. Asmail
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103804



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