Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: jon geist

Displaying records 21 to 30 of 88 records.
Resort by: Date / Title

21. User's Guide for SRM 2494 and 2495: The MEMS 5-in-1, 2011 Edition
Series: Special Publication (NIST SP)
Report Number: 260-179
Published: 9/6/2011
Authors: Janet M Cassard, Jon C Geist, Theodore Vincent Vorburger, David Thomas Read, David G Seiler
Abstract: The Microelectromechanical Systems (MEMS) 5-in-1 is a standard reference device sold as a NIST Standard Reference Material (SRM) that contains MEMS test structures on a test chip. The two SRM chips (2494 and 2495) provide for both dimensional an ...

22. Traceable Calibration of a Critical Dimension Atomic Force Microscope
Published: 6/6/2011
Authors: Ronald G Dixson, Ndubuisi George Orji, Craig Dyer McGray, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NI ...

23. Progress on CD-AFM tip width calibration standards
Published: 5/10/2011
Authors: Ronald G Dixson, Boon Ping Ng, Craig Dyer McGray, Ndubuisi George Orji, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) is developing a new generation of standards for calibration of CD-AFM tip width. These standards, known as single crystal critical dimension reference materials (SCCDRM) have features with ne ...

24. Entropophoresis of Single Biomolecules Down a Nanofluidic Staircase
Published: 1/11/2011
Authors: Samuel M Stavis, Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio

25. MEMS Microhotplate Temperature Sensor BIST: Importance and Applications
Published: 11/3/2010
Authors: Muhammad Yaqub Afridi, Jon C Geist
Abstract: This paper describe the importance of temperature sensor built-in self test (BIST) for microhotplate based sensors. It shows possible ways to implement BIST functionality for microhotplate temperature sensor, including Resistance Temperature Detector ...

26. MEMS Young's Modulus and Step Height Measurements with Round Robin Results
Published: 9/30/2010
Authors: Janet M Cassard, Richard A Allen, Craig Dyer McGray, Jon C Geist
Abstract: This paper presents the results of a microelectromechanical systems (MEMS) Young s modulus and step height round robin experiment, completed in April 2009, which compares Young s modulus and step height measurement results at a number of laboratories ...

27. Microwave-Induced Adjustable Nonlinear Temperature Gradients in Microfluidic Devices
Published: 9/29/2010
Authors: Jayna J Shah, Jon C Geist, Michael Gaitan
Abstract: We present a technique to induce temperature gradients in flexible microfluidic devices with microwave energy. Microwave power decays exponentially in the propagating medium, and the rate of decay is higher for water compared to polymers or glass du ...

28. The Forms and Functions of Complex Nanofluidic Surfaces
Published: 9/14/2010
Authors: Samuel M Stavis, Elizabeth A Strychalski, Jon C Geist, Laurie E Locascio, Michael Gaitan

29. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Published: 9/13/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan

30. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series