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Author: jon geist

Displaying records 11 to 20 of 78 records.
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11. Rectangular Scale-Similar Etch Pits in Monocrystalline Diamond
Published: 9/15/2011
Authors: Craig Dyer McGray, Richard A Allen, Marc J Cangemi, Jon C Geist
Abstract: Etching of monocrystalline diamond in oxygen and water vapor at 1100° C through small pores in a silicon nitride film produced smooth-walled rectangular cavities. The cavities were imaged by electron microscope and measured by interferometric microsc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908075

12. User's Guide for SRM 2494 and 2495: The MEMS 5-in-1, 2011 Edition
Series: Special Publication (NIST SP)
Report Number: 260-179
Published: 9/6/2011
Authors: Janet M Cassard, Jon C Geist, Theodore Vincent Vorburger, David Thomas Read, David G Seiler
Abstract: The Microelectromechanical Systems (MEMS) 5-in-1 is a standard reference device sold as a NIST Standard Reference Material (SRM) that contains MEMS test structures on a test chip. The two SRM chips (2494 and 2495) provide for both dimensional an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909186

13. Traceable Calibration of a Critical Dimension Atomic Force Microscope
Published: 6/6/2011
Authors: Ronald G Dixson, Ndubuisi George Orji, Craig Dyer McGray, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NI ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908552

14. Progress on CD-AFM tip width calibration standards
Published: 5/10/2011
Authors: Ronald G Dixson, Boon Ping Ng, Craig Dyer McGray, Ndubuisi George Orji, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) is developing a new generation of standards for calibration of CD-AFM tip width. These standards, known as single crystal critical dimension reference materials (SCCDRM) have features with ne ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911343

15. Entropophoresis of Single Biomolecules Down a Nanofluidic Staircase
Published: 1/11/2011
Authors: Samuel M Stavis, Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908403

16. MEMS Microhotplate Temperature Sensor BIST: Importance and Applications
Published: 11/3/2010
Authors: Muhammad Yaqub Afridi, Jon C Geist
Abstract: This paper describe the importance of temperature sensor built-in self test (BIST) for microhotplate based sensors. It shows possible ways to implement BIST functionality for microhotplate temperature sensor, including Resistance Temperature Detector ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906589

17. MEMS Young's Modulus and Step Height Measurements with Round Robin Results
Published: 9/30/2010
Authors: Janet M Cassard, Richard A Allen, Craig Dyer McGray, Jon C Geist
Abstract: This paper presents the results of a microelectromechanical systems (MEMS) Young s modulus and step height round robin experiment, completed in April 2009, which compares Young s modulus and step height measurement results at a number of laboratories ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904949

18. Microwave-Induced Adjustable Nonlinear Temperature Gradients in Microfluidic Devices
Published: 9/29/2010
Authors: Jayna J Shah, Jon C Geist, Michael Gaitan
Abstract: We present a technique to induce temperature gradients in flexible microfluidic devices with microwave energy. Microwave power decays exponentially in the propagating medium, and the rate of decay is higher for water compared to polymers or glass du ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904025

19. The Forms and Functions of Complex Nanofluidic Surfaces
Published: 9/14/2010
Authors: Samuel M Stavis, Elizabeth A Strychalski, Jon C Geist, Laurie E Locascio, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907053

20. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Published: 9/13/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907080