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You searched on: Author: jon geist

Displaying records 11 to 20 of 87 records.
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11. MEMS Kinematics by Super-Resolution Fluorescence Microscopy
Published: 9/27/2012
Authors: Craig Dyer McGray, Samuel M Stavis, Joshua Giltinan, Eric Eastman, Samara L. Firebaugh, Jenelle Piepmeier, Jon C Geist, Michael Gaitan
Abstract: Super-resolution fluorescence microscopy is used for the first time to study the nanoscale kinematics of a MEMS device in motion across a surface. A device under test is labeled with fluorescent nanoparticles that form a microscale constellation of n ...

12. Robust Auto-Alignment Technique for Orientation-Dependent Etching of Nanostructures
Published: 5/29/2012
Authors: Craig Dyer McGray, Richard J Kasica, Ndubuisi George Orji, Ronald G Dixson, Michael W. Cresswell, Richard A Allen, Jon C Geist
Abstract: A robust technique is presented for auto-aligning nanostructures to slow-etching crystallographic planes in materials with diamond cubic structure. Lithographic mask patterns are modified from the intended dimensions of the nanostructures to compen ...

13. The MEMS 5-in-1 Reference Materials (RM 8096 and 8097)
Published: 3/21/2012
Authors: Janet M Cassard, Jon C Geist, Michael Gaitan, David G Seiler
Abstract: The MEMS 5-in-1 Reference Material (RM) contains test structures for five standard test methods on one test chip, so companies can compare their in-house measurements taken on the RM with NIST measurements, thereby validating their use of the documen ...

14. Traceable Calibration of a Critical Dimension Atomic Force Microscope
Published: 3/9/2012
Authors: Ronald G Dixson, Ndubuisi George Orji, Craig Dyer McGray, John E Bonevich, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this program, and the focus of this paper, is the use of critical dimension atomic force ...

15. Quantitative Measurements of the Size Scaling of Linear and Circular DNA in Nanofluidic Slitlike Confinement
Published: 2/14/2012
Authors: Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio, Samuel M Stavis
Abstract: Quantitative size measurements of single linear and circular DNA molecules in nanofluidic slitlike confinement are reported. A novel experimental method using DNA entropophoresis down a nanofluidic staircase implemented comprehensive variation of sl ...

16. DNA Molecules Descending a Nanofluidic Staircase by Entropophoresis
Published: 1/26/2012
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan, Laurie E Locascio, Elizabeth A Strychalski
Abstract: A complex entropy gradient for confined DNA molecules was engineered for the first time. Following the second law of thermodynamics, this enabled the directed self-transport and self-concentration of DNA molecules. This new nanofluidic method is term ...

Published: 1/3/2012
Authors: Muhammad Yaqub Afridi, Christopher B Montgomery, Stephen Semancik, Kenneth Gruber Kreider, Jon C Geist
Abstract: In this paper we describe a novel long-term microhotplate temperature sensor calibration technique suitable for Built-In Self Test (BIST). The microhotplate thermal resistance (thermal efficiency) and the thermal voltage from an integrated platinum-r ...

Published: 10/3/2011
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan, Laurie E Locascio, Elizabeth A Strychalski
Abstract: Entropophoresis ‹ motion caused by an entropy gradient ‹ is a novel nanofluidic method to direct the self-transport of biopolymers that established a new paradigm of nanofluidic functionality with broad relevance to lab-on-a-chip technol-ogy. He ...

19. Rectangular Scale-Similar Etch Pits in Monocrystalline Diamond
Published: 9/15/2011
Authors: Craig Dyer McGray, Richard A Allen, Marc J Cangemi, Jon C Geist
Abstract: Etching of monocrystalline diamond in oxygen and water vapor at 1100° C through small pores in a silicon nitride film produced smooth-walled rectangular cavities. The cavities were imaged by electron microscope and measured by interferometric microsc ...

20. User's Guide for SRM 2494 and 2495: The MEMS 5-in-1, 2011 Edition
Series: Special Publication (NIST SP)
Report Number: 260-179
Published: 9/6/2011
Authors: Janet M Cassard, Jon C Geist, Theodore Vincent Vorburger, David Thomas Read, David G Seiler
Abstract: The Microelectromechanical Systems (MEMS) 5-in-1 is a standard reference device sold as a NIST Standard Reference Material (SRM) that contains MEMS test structures on a test chip. The two SRM chips (2494 and 2495) provide for both dimensional an ...

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