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Author: roy geiss
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1. Acoustical methods to determine thin-film and nanoscale mechanical properties
Published: 5/31/2005
Authors: Donna C. Hurley, Roy Howard Geiss, N Jennett, Malgorzata Kopycinska-Mueller, A Maxwell, Jens Mueller, David Thomas Read, J Wright
Abstract: We describe two acoustical methods to evaluate the mechanical properties of thin films and nanoscale structures: atomic force acoustic microscopy and surface acoustic wave spectroscopy. The elastic properties of an 800-nm-thick nickel film were exami ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50075

2. An Electrical Method for Measuring Fatigue and Tensile Properties of Thin Films on Substrates
Published: 8/15/2007
Authors: Robert R Keller, Nicholas Barbosa, Roy Howard Geiss, David Thomas Read
Abstract: A novel approach for measuring thermal fatigue lifetime and ultimate strength of patterned thin films on substrates is presented. The method is based on controlled application of cyclic joule heating by means of low-frequency, high-density alternatin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50479

3. Anisotropic elastic properties of nanocrystalline nickel thin films
Published: 5/1/2006
Authors: Donna C. Hurley, Roy Howard Geiss, N Jennett, Malgorzata Kopycinska-Mueller, A Maxwell, Jens Mueller, David Thomas Read, J Wright
Abstract: As length scales continue to shrink, new tools are needed to measure mechanical properties. We are developing two such tools using different nondestructive acoustical techniques. Surface acoustic wave spectroscopy (SAWS) uses laser-ultrasonic methods ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50050

4. COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD
Published: 10/2/2006
Authors: Jens Mueller, Davor Balzar, Roy Howard Geiss, David Thomas Read, Robert R Keller
Abstract: Texture in materials has a large influence on many properties of thin films; it is customarily determined by neutron or X-ray diffraction by measuring pole figures and evaluating orientation-distribution functions (ODF). X-ray diffraction (XRD) was t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50205

5. Characterization of InGaN quantum disks in GaN nanowires
Published: 3/4/2014
Authors: Alexana Roshko, Roy Howard Geiss, John B Schlager, Matthew David Brubaker, Kristine A Bertness, Norman A Sanford, Todd E Harvey
Abstract: Catalyst-free GaN nanowires with InGaN quantum disks (QDs) were characterized by scanning/transmission elec-tron microscopy (S/TEM) and photoluminescence. A va-riety of structures, from QDs with large strain fields to apparently strain free QDs were ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914871

6. Constraint Effect in Deformation of Copper Interconnect Lines Subjected to Cyclic Joule Heating
Published: 11/26/2007
Authors: David Thomas Read, Roy Howard Geiss, Nicholas Barbosa
Abstract: Using finite element analysis, we calculate the temperature range and the resulting cyclic Von Mises strain resulting from Joule heating, generated by the application of alternating current, applied to specimens representative of commercial copper da ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901599

7. Contact mechanics and tip shape in afm-based nanomechanical measurements
Published: 8/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: Stiffness-load curves obtained in quantitative atomic force acoustic microscopy (AFAM) measurements depend on both the elastic properties of the sample and the geometry of the atomic force microscope (AFM) tip. The geometry of silicon AFM tips change ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50203

8. Effect of microstructure on magnetic properties and anisotropy distributions in Co/Pd thin films and nanostructures
Published: 11/19/2009
Authors: Justin M Shaw, Hans Toya Nembach, Thomas J Silva, Stephen E Russek, Roy Howard Geiss
Abstract: The structure of Co/Pd multilayers has a strong effect on the localized anisotropy distribution within a film and the resulting switching properties of nanostructures fabricated from identical material. By varying the underlying seed layer, the micr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903594

9. Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering
Published: 1/18/2010
Authors: Ward L Johnson, Sudook A Kim, Roy Howard Geiss, Colm Flannery, Paul R Heyliger, Christopher L Soles, Wen-Li Wu, Chengqing C. Wang, Christopher M Stafford, B D. Vogt
Abstract: Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903959

10. Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
Published: 4/5/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Jens Mueller, Donna C. Hurley
Abstract: Atomic force acoustic microscopy (AFAM), an emerging technique that affords nanoscale lateral and depth resolution, was employed to measure the elastic properties of ultrathin films. In this study we measured the indentation modulus M of three nickel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50093



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