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Author: roy geiss

Displaying records 21 to 30 of 38 records.
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21. COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD
Published: 10/2/2006
Authors: Jens Mueller, Davor Balzar, Roy Howard Geiss, David Thomas Read, Robert R Keller
Abstract: Texture in materials has a large influence on many properties of thin films; it is customarily determined by neutron or X-ray diffraction by measuring pole figures and evaluating orientation-distribution functions (ODF). X-ray diffraction (XRD) was t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50205

22. Anisotropic elastic properties of nanocrystalline nickel thin films
Published: 5/1/2006
Authors: Donna C. Hurley, Roy Howard Geiss, N Jennett, Malgorzata Kopycinska-Mueller, A Maxwell, Jens Mueller, David Thomas Read, J Wright
Abstract: As length scales continue to shrink, new tools are needed to measure mechanical properties. We are developing two such tools using different nondestructive acoustical techniques. Surface acoustic wave spectroscopy (SAWS) uses laser-ultrasonic methods ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50050

23. Size-related plasticity effects in AFM silicon cantilever tips
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

24. Elastodynamic characterization of imprinted nanolines
Published: 4/3/2006
Authors: Ward L Johnson, Colm Flannery, Sudook A Kim, Roy Howard Geiss, Christopher L Soles, Paul R Heyliger
Abstract: Experimental techniques employing Brillouin light scattering (BLS) and analytical techniques employing finite-element (FE) and Farnell-Adler models are being developed for characterizing acoustic modes and determining elastic moduli and dimensions o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50332

25. Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
Published: 9/23/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We describe a dynamic atomic force microscopy (AFM) method to measure the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques and involves the resonant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50024

26. Electrical Methods for Mechanical Characterization of Interconnect Thin Films
Published: 9/1/2005
Authors: Robert R Keller, Cynthia A. Volkert, Roy Howard Geiss, Andrew J Slifka, David Thomas Read, Nicholas Barbosa, Reiner Monig
Abstract: We describe the use of electrical methods for evaluating mechanical reliability and properties of patterned copper and aluminum interconnects on silicon substrates. The approach makes use of controlled Joule heating, which causes thermal strains in t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50210

27. Contact mechanics and tip shape in afm-based nanomechanical measurements
Published: 8/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: Stiffness-load curves obtained in quantitative atomic force acoustic microscopy (AFAM) measurements depend on both the elastic properties of the sample and the geometry of the atomic force microscope (AFM) tip. The geometry of silicon AFM tips change ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50203

28. Quantitative Elastic-Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy
Published: 8/31/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We are developing metrology for rapid, quantitative assessment of elastic porperties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable modulus measurements at either a single point or as a map of local property ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50097

29. Acoustical methods to determine thin-film and nanoscale mechanical properties
Published: 5/31/2005
Authors: Donna C. Hurley, Roy Howard Geiss, N Jennett, Malgorzata Kopycinska-Mueller, A Maxwell, Jens Mueller, David Thomas Read, J Wright
Abstract: We describe two acoustical methods to evaluate the mechanical properties of thin films and nanoscale structures: atomic force acoustic microscopy and surface acoustic wave spectroscopy. The elastic properties of an 800-nm-thick nickel film were exami ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50075

30. Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
Published: 4/5/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Jens Mueller, Donna C. Hurley
Abstract: Atomic force acoustic microscopy (AFAM), an emerging technique that affords nanoscale lateral and depth resolution, was employed to measure the elastic properties of ultrathin films. In this study we measured the indentation modulus M of three nickel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50093



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