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Author: michael gaitan
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1. A Modified Sliding Wire Potentiometer Test Structure for Mapping Nanometer-Level Distances
Published: 12/31/1991
Authors: Michael W Cresswell, Michael Gaitan, Richard A Allen, Loren W. Linholm
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21586

2. A Numerical Analysis for the Small-Signal Response of the MOS Capacitor
Published: 12/31/1989
Authors: Michael Gaitan, I. D. Mayergoyz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14307

3. Accuracy of the Charge Pumping Technique for Small Geometry MOSFETs,
Published: 12/1/1989
Authors: Michael Gaitan, E. Enlow, Thomas J. Russell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29903

4. Accurate optical analysis of single molecule entrapment in nanoscale vesicles
Published: 1/1/2010
Authors: Joseph E. (Joseph E.) Reiner, Andreas Jahn, Samuel M Stavis, Michael J Culbertson, Wyatt N Vreeland, Daniel L Burden, Jon C Geist, Michael Gaitan
Abstract: We present a non-destructive method to characterize low analyte concentrations in nanometer scale lipid vesicle formulations. Our method is based on the application of fluorescence fluctuation analysis (FFA) and multi-angle laser light scattering (M ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902169

5. Ag/AgCl Microelectrodes with Improved Stability for Microfluidics
Published: 3/30/2006
Authors: Brian J. Polk, Anna Stelzenmuller, Geraldine I. Mijares, William Ambrose MacCrehan, Michael Gaitan
Abstract: A method for fabricating Ag/AgCl planar microelectrodes for microfluidic applications is presented. Microreference electrodes enable accurate measurements with miniaturized chemical sensors but such electrodes often exhibit very limited useable lifet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31837

6. An Efficient Method to Compute the Maximum Transient Drain Current Overshoot in Silicon on Insulator
Published: 3/15/1993
Authors: C. E. Korman, I. D. Mayergoyz, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2499

7. An Experimental Comparison of Measurement Techniques to Extract Si-SiO^d2^ Interface Trap Density
Published: 12/31/1992
Authors: S C Witczak, John S Suehle, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16528

8. Analysis of Fixed-Fixed Beam Test Structures
Published: 12/31/1996
Authors: Janet M Cassard, David Thomas Read, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10332

9. Application of CMOS-Compatible Micro-Hotplates for In-Situ Process Monitors
Published: 12/31/1992
Authors: John S Suehle, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14325

10. Art in Science
Published: 2/22/2011
Authors: Michael Gaitan, Laurie E Locascio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908028



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