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1. Origin of the Crossover Between a Freezing and a Structural Transition at Low Concentration in the Relaxor Ferroelectric K^d1-x^LI^dx^TaO^d3^
Published: 4/16/2015
Authors: Ling Cai, Jean Toulouse, Leland Weldon Harriger, Robert G Downing, Lynn A. Boatner
Abstract: The origin of the relaxor behavior in {I}K^d1-x^Li^dx^TaO^d3^{/I}(KLT) and other disordered perovskites has long been recognized as due to the reorientation of the polar nanodomains (PNDs) which are formed by the correlated disordered dipoles. The th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917577

2. In Situ Neutron Techniques for Studying Lithium Ion Batteries
Published: 5/1/2012
Authors: Howard Wang, Robert G Downing, Joseph A Dura, Daniel S Hussey
Abstract: We review {I}in situ{/I} neutron techniques for studying lithium ion batteries. Four neutron measurement techniques, neutron depth profiling (NDP), neutron reflectivity (NR), small angle neutron scattering (SANS), and neutron imaging (NI) are discus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909639

3. Neutron Depth Profiling Technique for Studying Aging in Li-ion Batteries
Published: 2/15/2011
Author: Robert G Downing
Abstract: During operation of a Li-ion cell, lithium diffuses in and out of the solid phase anode and cathode. Measuring the lithium transport within the cell over its operational life could provide key information for understanding the loss of active lithiu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907549

4. Cold-Neutron Depth Profiling as a Research Tool for the Study of Surface Oxides on Metals
Published: 10/7/2010
Authors: Robert G Downing, Z Tun, J.J. Noel, Th Bohdanowicz, L.R. Cao
Abstract: A recent experiment at NIST has demonstrated that neutron depth profiling (NDP) based on (n,α) reaction could be developed into a tool routinely used for the study of passive oxides on metals. Whereas most metals are not (n,α) active, oxide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905658

5. Observation of Phase Transitions in Hydrogenated Y Films Via IR Emissivity Imaging
Published: 10/20/2009
Authors: Jason Hattrick-Simpers, Ke Wang, Raymond Cao, Chun Chiu, Edwin J Heilweil, Robert G Downing, Leonid A Bendersky
Abstract: Direct observation of a sequence of phase transitions during hydrogenation of Y thin films has been realized through the use of in-situ isothermal IR emissivity measurements. The formation of different phases, α-Y(H), YH2 and YH3, has been id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902713

6. Combinatorial Study of Thin Film Metal Hydride by Prompt Gamma Activation Analysis
Published: 6/19/2009
Authors: Raymond Cao, Jason Hattrick-Simpers, Richard Bindel, Bryan E. Tomlin, Rolf Louis Zeisler, Rick L. Paul, Leonid A Bendersky, Robert G Downing
Abstract: Cold neutron prompt gamma activation analysis (PGAA) was used to determine the amount of hydrogen in thin film Mg hydrides with varying hydrogenation times. The results suggest that the hydrogenation in the Mg thin films remains unsaturated even afte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902373

7. Development and Applications of Time-of-Flight Neutron Depth Profiling (TOF-NDP)
Published: 6/1/2008
Authors: S M Cetiner, K Unlu, Robert G Downing
Abstract: Neutron depth profiling (NDP) is a surface analysis technique based on the illumination of samples with thermal or sub-thermal neutrons, and subsequent release of charged particles. Emitted particles rapidly lose kinetic energy primarily through int ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832148

8. Advancement of Light-Element Neutron Depth Profiling at the University of Texas
Published: 4/1/2008
Authors: S M Whitney, Robert G Downing, S Biegalski, D S O'Kelly
Abstract: The University of Texas (UT) at Austin has collaborated with the National Institute of Standards and Technology for comparisons of concentration versus depth profiles of samples containing 10B. Technology sharing from NIST has allowed UT to avoid ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832160

9. Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers
Published: 11/1/2007
Authors: Robert G Downing, David S Simons, George Paul Lamaze, Richard Mark Lindstrom, Robert Russ Greenberg, Rick L. Paul, Susannah B. Schiller, William F Guthrie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904275

10. Neutron Collimation with Microchannel Plates: Calibration of Existing Technology and Near Future Possibilities
Published: 11/1/2007
Authors: Robert G Downing, Daniel S Hussey, A S Tremsin, David F. R. Mildner, W B Feller, David L Jacobson, Muhammad Arif, O H Siegmund
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904280



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