NIST logo

Publications Portal

You searched on: Author: jack douglas

Displaying records 11 to 20 of 225 records.
Resort by: Date / Title


11. Dynamic light scattering investigations of nanoparticle aggregation following a light-induced pH jump
Published: 5/19/2010
Authors: Ryan Murphy, Denis Pristinski, Kalman D Migler, Jack F Douglas, Vivek M Prabhu
Abstract: We use dynamic light scattering to characterize the kinetics of nanoparticle aggregation. The aggregation process was conveniently initiated in photoacid generator (PAG) solutions where changes in the pH of the solution can be controlled by exposure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904974

12. Wrinkling and Strain Softening in Single-Wall Carbon Nanotube Membranes
Published: 3/26/2010
Authors: Erik K. Hobbie, Daneesh Olivia Simien, Jeffrey A Fagan, JiYeon Huh, Jun Y. Chung, Steven D Hudson, Jan Obrzut, Jack F Douglas, Christopher M Stafford
Abstract: Ultrathin layers of single-wall carbon nanotubes (SWCNTs) show considerable promise for applications ranging from fuel-cell membranes and biochemical sensors to bioactive films and transparent electrodes. The high conductivity and extreme anisotropy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904589

13. Relaxation and antiplasticization measurements in trehalose-glycerol mixtures; a model formulation for protein preservation
Published: 1/28/2010
Authors: Jan Obrzut, A Anopchenko, Jack F Douglas, Bert W Rust
Abstract: We utilize dielectric relaxation process for the quantitative characterization of antiplasticization of trehalose by glycerol. The high frequency Johari-Goldstein relaxation time was obtained by analyzing the complex permittivity data in terms of the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901278

14. Solvent Retention In Thin Spin-Coated Polystyrene And Poly(Methyl Methacrylate) Homopolymer Films Studied By Neutron Reflectometry
Published: 1/19/2010
Authors: Xiaohua Zhang, Kevin G. Yager, Shuhui Kang, Nathaniel J Fredin, Bulent Akgun, Sushil K Satija, Jack F Douglas, Alamgir Karim, Ronald Leland Jones
Abstract: We utilize neutron reflectometry (NR) to probe the amount of residual solvent inside thin polystyrene (PS) and poly(methyl methacrylate) (PMMA) films spin-coated from deuterated toluene polymer solutions onto silicon substrates . The effect of therma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903220

15. Capillary Instability in Nanoimprinted Polymer Films
Published: 5/21/2009
Authors: Kyle J. Alvine, Yifu Ding, Hyun Wook Ro, Brian C. Okerberg, Alamgir Karim, Christopher L Soles, Jack F Douglas
Abstract: Capillary forces play an active role in defining the equilibrium structure of nanoscale structures. This effect can be especially pronounced in soft materials such as polymers near or above their glass transition temperatures where material flow is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852751

16. Grain boundaries exhibit the dynamics of glass-forming liquids
Published: 5/12/2009
Authors: James A Warren, Jack F Douglas, Hao Zhang, David J Srolovitz
Abstract: Polycrystalline materials are composites of crystalline particles or grains separated by thin amorphous grain boundaries (GBs). Although GBs have been exhaustively investigated at low temperatures, at which these regions are relatively ord ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901918

17. Equilibrium Polymerization Models of Reentrant Self-Assembly
Published: 4/24/2009
Authors: Jacek Dudowicz, Jack F Douglas, Karl Freed
Abstract: As is well known, liquid-liquid phase separation can occur either upon heating or cooling, corresponding to lower and upper critical solution phase boundaries, respectively. Likewise, self-assembly transitions from a monomeric state to an organized ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901053

18. Dielectric Spectroscopy Investigation of Relaxation in C60-Polyisoprene Nanocomposites
Published: 3/23/2009
Authors: Yifu Ding, Sebastian Pawlus, Alexei Sokolov, Jack F Douglas, Alamgir Karim, Christopher L Soles
Abstract: We investigate the influence of adding C60 nanoparticles on the dielectric relaxation spectra of both unentangled and entangled polyisoprene (PIP). Relaxation modes corresponding to both segmental and chain relaxation were analyzed over a broad tempe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900194

19. Competition Between Self-Assembly and Surface Adsorption
Published: 2/25/2009
Authors: Jacek Dudowicz, Jack F Douglas, Karl Freed
Abstract: We investigate a minimal equilibrium polymerization model of the general competition between self-assembly on a boundary and in solution that arises when an assembling system is near a boundary. Adsorption generally occurs upon cooling, but assembly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854465

20. Particle Motion During the Compaction of Granular Matter
Published: 12/19/2008
Authors: Steven Slotterback, Masahiro Toiya, Leonard Goff, Jack F Douglas, Wolfgang Losert
Abstract: We track particle motions in a granular material subjected to compaction using a laser scattering based imaging method where compaction is achieved through thermal cycling. Particle displacements in this jammed fluid correlate strongly with rearrangm ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853585



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series