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You searched on: Author: marc desrosiers

Displaying records 21 to 30 of 74 records.
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21. Next-Generation Services for e-Traceability to Ionizing Radiation National Standards
Published: 1/1/2006
Authors: Marc F Desrosiers, James M Puhl, S L Cooper

22. Time Dependence of the Radiation-induced EPR Signal in Sucrose
Published: 1/1/2006
Authors: Marc F Desrosiers, S Wadley

23. Transferability Study of the EPR-Tooth Dosimetry Technique
Published: 1/1/2006
Authors: S Sholom, V Chumak, Marc F Desrosiers, A Bouville

24. Irradiation Decontamination of Postal Mail and High-Risk Luggage, ed. by L.G. Gazs {?} and C.C. Ponta
Published: 1/1/2005
Authors: Marc F Desrosiers, Bert M Coursey, Stephen Michael Seltzer, Lawrence T Hudson, Paul Mark Bergstrom, Fred B Bateman, James M Puhl, S L Cooper, D J Alderson, G B Knudson, T B Elliott, M O Shoemaker, S D Miller, J Dunlop

25. A Study of the Alanine Dosimeter Irradiation Temperature Coefficient in the -77 {?}C to +50 {?}C Range
Published: 1/1/2004
Authors: Marc F Desrosiers, S L Cooper, James M Puhl, A L Mcbain, G W Calvert

26. Characterization of a New Alanine Film Dosimeter: Relative Humidity and Post-Irradiation Stability
Published: 1/1/2004
Authors: R M Garcia, Marc F Desrosiers, J G Attwood, D Steklenski, J Griggs, A Ainsworth, A Heiss, P Mellor, D Patil, J Meiner

27. Irradiation Applications for Homeland Security
Published: 1/1/2004
Author: Marc F Desrosiers

28. Ionizing Radiation Inactivation of Vaccinia Virus Using Gamma Photons
Published: 1/1/2003
Authors: R J Lowy, C C Broder, Y R Feng, Marc F Desrosiers, T B Elliott

29. NIST Accelerator Facilities and Programs in Support of Industrial Radiation Research, ed. by J.L. Duggan and I.L. Morgan
Published: 1/1/2003
Authors: Fred B Bateman, Marc F Desrosiers, Lawrence T Hudson, Bert M Coursey, F. P Bergstrom, Stephen Michael Seltzer

30. Calibrations: Using the Internet to Deliver Calibration Services in Real Time at Lower Cost
Published: 1/1/2002
Authors: Marc F Desrosiers, V Yu Nagy, James M Puhl, R Glenn, R Densock, D Stieren, B Lang, A Kamlowski, D Maier, A Heiss

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series