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Author: bradley damazo
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1. Nanoparticle Size and Shape Evaluation Using the TSOM Method
Published: 6/1/2012
Authors: Bradley N Damazo, Ravikiran (Ravikiran) Attota, Premsagar Purushotham Kavuri, Andras Vladar
Abstract: A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be used here for nanoparticle dimensional analysis. The TSOM method can distinguish not only ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911138

2. Microscopy for STEM Educators
Published: 5/21/2012
Authors: Michael T Postek, Mary B Satterfield, Bradley N Damazo, Robert Gordon
Abstract: The future of our nation hinges on our ability to prepare our next generation to be innovators in science, technology, engineering and math (STEM). Excitement for STEM must begin at the earliest stages of our education process. Yet, today far too few ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910648

3. Accurate Nanometer-Scale Imaging and Measurements with SEM
Published: 8/18/2011
Authors: Bradley N Damazo, Bin Ming, Premsagar Purushotham Kavuri, Andras Vladar, Michael T Postek
Abstract: Scanning electron microscopes (SEMs) are incredibly versatile instruments for millimeter to nanometer scale imaging and measurements of size and shape. New methods to improve repeatability and accuracy have been implemented on the so-called Referenc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909147

4. Development of a metrology frame to improve the positioning accuracy of micro/meso-scale machine tools
Published: 8/3/2009
Authors: Shawn P Moylan, Daehie Hong, Bradley N Damazo, Johannes A Soons, M Alkan Donmez
Abstract: The small size of the work volume of micro/meso-scale machine tools often presents problems for calibration and error compensation, but at the same time provides opportunity for solutions not practical on the traditional scale. Measuring tool positi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824676

5. Implementation of a metrology frame to improve positioning of micro/meso-scale machine tools
Published: 7/15/2009
Authors: Shawn P Moylan, Bradley N Damazo, M Alkan Donmez
Abstract: Metrology frames have proven to be an excellent tool for improving the accuracy of machine tools, and because of the small sizes and travels involved, they may be an excellent fit for micro/meso-scale machine tools. We have developed a metrology fram ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900171

6. Damping mechanisms for precision applications in UHV environment
Published: 5/1/2006
Authors: Sumanth B. Chikkamaranahalli, R. R Vallance, Bradley N Damazo, Richard M Silver
Abstract: Surface analysis techniques such as scanning probe microscopy (SPM) have undergone significant advances and are attractive for application to electron and optical devices such as micro lenses, vacuum tubes, electron tubes, etc. For surface stability ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822541

7. Dynamic Modeling and Vibration Analysis of a UHV Scanning Tunneling
Published: 8/17/2005
Authors: Sumanth B. Chikkamaranahalli, R. R Vallance, Bradley N Damazo, Richard M Silver, James D Gilsinn
Abstract: Techniques based on scanning probe microscopy (SPM) are used to fabricate surface structures with dimensions ranging from 10 - 100mm. These structures have been fabricated and imaged using a scanning tunneling microscope (STM), and the STM requires ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822269

8. Laser Sample Stage-Based Image Resolution Enhancement Method for SEMs
Published: 5/24/2004
Authors: Andras Vladar, Crossley E Jayewardene, Bradley N Damazo, William J. Keery, Michael T Postek
Abstract: The development of a very fast, very accurate laser stage measurement system facilitates a new method to enhance the image and line scan resolution of scanning electron microscopes (SEMs). This method, allows for fast signal intensity and displacemen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822157

9. Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications
Published: 3/11/2004
Authors: James D Gilsinn, Hui Zhou, Bradley N Damazo, Joseph Fu, Richard M Silver
Abstract: As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One diffi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822480

10. Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications
Published: 3/1/2004
Authors: James D Gilsinn, Hui Zhou, Bradley N Damazo, Joseph Fu, Richard M Silver
Abstract: As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One diffi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822172



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