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Author: bradley damazo

Displaying records 11 to 20 of 30 records.
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11. New Method for the Measurement of SEM Stage Vibrations
Published: 2/1/2004
Authors: Bradley N Damazo, Crossley E Jayewardene, Andras Vladar, William J. Keery, Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823322

12. Atomic-Resolution Measurements With a New Tunable Diode Laser-Based Interferometer
Published: 1/1/2004
Authors: Richard M Silver, H Zou, S Gonda, Bradley N Damazo, Jay Shi Jun, Carsten P. Jensen, Lowell P. Howard
Abstract: We have developed a new implementation of a Michelson interferometer which has demonstrated better than 20 picometer resolution measurement capability. This new method uses a tunable diode laser as the light source with the laser wavelength continuou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822419

13. Developing Atomic-Resolution Measurements Using a Tunable Diode Laser-Based Interferometer
Published: 10/1/2003
Authors: Hui Zhou, Bradley N Damazo, S Gonda, Richard M Silver
Abstract: A new implementation of a Michelson interferometer capable of resolution on the order of 20 pm has been developed.  This new method uses a tunable diode laser as the light source with the diode laser wavelength continuously tuned to fix the numb ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822230

14. Performance Evaluation of a Prototype Machine Tool for Machining Meso-scaled Parts
Published: 1/1/2003
Authors: Bradley N Damazo, M Alkan Donmez, Michael L McGlauflin, J B Werkmeister, Johannes A Soons, S C Bryant, Alex Slocum
Abstract: With the increased prevalence of meso-scaled products and feature sizes, new tools are needed to bridge the gap between fabrication processes tailored for micrometer and millimeter sized features [1-4]. Compared to its traditional counterpart, a sma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821948

15. A Macro-Micro Motion System for a STM
Published: 6/13/2002
Authors: Bradley N Damazo, James D Gilsinn, Richard M Silver, Hui Zhou
Abstract: As nano-lithography improves, more companies and research groups have the capability to create nano-scale structures. Scanning Tunneling Microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One difficulty is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821683

16. Design and Development of a Measurement and Control System for Measuring SEM Magnification Calibration Samples
Published: 6/1/2002
Authors: Crossley E Jayewardene, William J. Keery, Michael T Postek, Andras Vladar, Bradley N Damazo
Abstract: The National Institute of Standards and Technology (NIST) has provided industry with a scanning electron microscope (SEM) magnification calibration sample Reference Material (RM) 8090. The certified, Standard Reference Material (SRM) version, SRM 209 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821755

17. Nanomanufacturing of Atom-Based Dimensional Standards - A Final Project Report of the NAMT
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6850
Published: 1/1/2002
Authors: Robert Allen, J J. Pellegrino, D Monk, E Clayton Teague, Dennis A Swyt, Joseph Fu, Richard M Silver, Theodore Vincent Vorburger, Bradley N Damazo, Robert Russell, Thomas E Wheatley, Keith A Stouffer, Manfred Osti, David Wilmering, Richard L. Rhorer, Ram D Sriram
Abstract: This report describes the accomplishments of the Nanomanufacturing of Atom-based Dimensional Standards Project, which operated as part of the National Advanced Manufacturing Testbed (NAMT) a program formally operating from fiscal year (FY) 1996 to FY ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821672

18. SEM Sentinel-SEM Performance Measurement System
Published: 8/1/2001
Authors: Bradley N Damazo, Andras Vladar, Alice V. Ling, M Alkan Donmez, Michael T Postek, Crossley E Jayewardene
Abstract: This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagnosis of the vacuum system and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821586

19. Embedded Power Quality Solutions for Computer Numerical Control Machine Tools
Published: 1/1/2001
Authors: Bradley N Damazo, M Stephens, Johannes A Soons, M Alkan Donmez
Abstract: Electric Power Research Institute (EPRI) research and testing, conducted over many years, has indicated that variations in electric power quality can negatively impact end-use equipment. This research and testing has helped to form the theory that th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821867

20. SEM Sentinel - SEM Performance Measurement System
Published: 1/1/2001
Authors: Bradley N Damazo, Andras Vladar, Alice V. Ling, M Alkan Donmez, Michael T Postek, Crossley E Jayewardene
Abstract: This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagnosis of the vacuum system an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823137



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  • SP 250-XX: Calibration Services
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