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You searched on: Author: bradley damazo

Displaying records 11 to 20 of 31 records.
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11. Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications
Published: 3/1/2004
Authors: James D Gilsinn, Hui Zhou, Bradley N Damazo, Joseph Fu, Richard M Silver
Abstract: As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One diffi ...

12. New Method for the Measurement of SEM Stage Vibrations
Published: 2/1/2004
Authors: Bradley N Damazo, Crossley E Jayewardene, Andras Vladar, William J. Keery, Michael T Postek

13. Atomic-Resolution Measurements With a New Tunable Diode Laser-Based Interferometer
Published: 1/1/2004
Authors: Richard M Silver, H Zou, S Gonda, Bradley N Damazo, Jay Shi Jun, Carsten P. Jensen, Lowell P. Howard
Abstract: We have developed a new implementation of a Michelson interferometer which has demonstrated better than 20 picometer resolution measurement capability. This new method uses a tunable diode laser as the light source with the laser wavelength continuou ...

14. Developing Atomic-Resolution Measurements Using a Tunable Diode Laser-Based Interferometer
Published: 10/1/2003
Authors: Hui Zhou, Bradley N Damazo, S Gonda, Richard M Silver
Abstract: A new implementation of a Michelson interferometer capable of resolution on the order of 20 pm has been developed.  This new method uses a tunable diode laser as the light source with the diode laser wavelength continuously tuned to fix the numb ...

15. Performance Evaluation of a Prototype Machine Tool for Machining Meso-scaled Parts
Published: 1/1/2003
Authors: Bradley N Damazo, M Alkan Donmez, Michael L McGlauflin, J B Werkmeister, Johannes A Soons, S C Bryant, Alex Slocum
Abstract: With the increased prevalence of meso-scaled products and feature sizes, new tools are needed to bridge the gap between fabrication processes tailored for micrometer and millimeter sized features [1-4]. Compared to its traditional counterpart, a sma ...

16. A Macro-Micro Motion System for a STM
Published: 6/13/2002
Authors: Bradley N Damazo, James D Gilsinn, Richard M Silver, Hui Zhou
Abstract: As nano-lithography improves, more companies and research groups have the capability to create nano-scale structures. Scanning Tunneling Microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One difficulty is ...

17. Design and Development of a Measurement and Control System for Measuring SEM Magnification Calibration Samples
Published: 6/1/2002
Authors: Crossley E Jayewardene, William J. Keery, Michael T Postek, Andras Vladar, Bradley N Damazo
Abstract: The National Institute of Standards and Technology (NIST) has provided industry with a scanning electron microscope (SEM) magnification calibration sample Reference Material (RM) 8090. The certified, Standard Reference Material (SRM) version, SRM 209 ...

18. Nanomanufacturing of Atom-Based Dimensional Standards - A Final Project Report of the NAMT
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6850
Published: 1/1/2002
Authors: Robert Allen, J J. Pellegrino, D Monk, E Clayton Teague, Dennis A Swyt, Joseph Fu, Richard M Silver, Theodore Vincent Vorburger, Bradley N Damazo, Robert Russell, Thomas E Wheatley, Keith A Stouffer, Manfred Osti, David Wilmering, Richard L. Rhorer, Ram D Sriram
Abstract: This report describes the accomplishments of the Nanomanufacturing of Atom-based Dimensional Standards Project, which operated as part of the National Advanced Manufacturing Testbed (NAMT) a program formally operating from fiscal year (FY) 1996 to FY ...

19. SEM Sentinel-SEM Performance Measurement System
Published: 8/1/2001
Authors: Bradley N Damazo, Andras Vladar, Alice V. Ling, M Alkan Donmez, Michael T Postek, Crossley E Jayewardene
Abstract: This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagnosis of the vacuum system and ...

20. Embedded Power Quality Solutions for Computer Numerical Control Machine Tools
Published: 1/1/2001
Authors: Bradley N Damazo, M Stephens, Johannes A Soons, M Alkan Donmez
Abstract: Electric Power Research Institute (EPRI) research and testing, conducted over many years, has indicated that variations in electric power quality can negatively impact end-use equipment. This research and testing has helped to form the theory that th ...

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