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1. In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films
Published: 4/19/2016
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: The pressure induced phase transitions of crystalline Si films was studied in situ under a Berkovich probe using the Raman spectroscopy-enhanced instrumented indentation technique. The observations suggested strain and time as important parameters in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920074

2. Stochastic behavior of nanoscale dielectric wall buckling
Published: 3/16/2016
Authors: Lawrence H Friedman, Igor Levin, Robert Francis Cook
Abstract: The random buckling patterns of nanoscale dielectric walls are analyzed using a nonlinear multi-scale stochastic method that combines experimental measurements with simulations. The dielectric walls, approximately 200 nm tall and 20 nm wi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914680

3. Assessing Electron Backscattered Diffraction and Confocal Raman Microscopy Strain Mapping Using Wedge-indented Si
Published: 2/17/2016
Authors: Lawrence H Friedman, Mark D Vaudin, Stephan J Stranick, Gheorghe Stan, Yvonne Beatrice Gerbig, William A Osborn, Robert Francis Cook
Abstract: The accuracy of electron backscattered diffraction (EBSD) and confocal Raman microscopy (CRM) for small-scale strain mapping are assessed using the multi-axial strain field surrounding a wedge indentation in Si as a test vehicle. The strain field is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919078

4. In situ spectroscopic study of the plastic deformation of amorphous silicon under non-hydrostatic conditions
Published: 12/17/2015
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook, Jodie E. Bradby
Abstract: Indentation-induced plastic deformation of amorphous silicon (a-Si) thin films was studied by in situ Raman imaging of the deformed contact region of an indented sample, employing a Raman spectroscopy-enhanced instrumented indentation technique (IIT) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918450

5. Heterogeneity and length scale effects in PEG-based hydrogels
Published: 8/10/2015
Authors: Brian G Bush, Jenna M Shapiro, Frank W DelRio, Robert Francis Cook, Michelle L. Oyen
Abstract: Colloidal-probe spherical indentation load-relaxation experiments are conducted on poly(ethylene glycol) (PEG) hydrogel materials to quantify the steady-state mechanical properties and time-dependent transport properties in a single experiment. A pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917666

6. Fracture strength of micro- and nano-scale silicon components
Published: 5/13/2015
Authors: Frank W DelRio, Robert Francis Cook, Brad Boyce
Abstract: Silicon devices are ubiquitous in many micro- and nano-scale technological applications, most notably microelectronics and microelectromechanical systems (MEMS). Despite their widespread usage, however, issues related to uncertain mechanical reliabi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917944

7. In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films
Published: 2/14/2015
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman imaging of the deformed contact region of silicon, employing a Raman spectroscopy-enhanced instrumented indentation technique. This is, to our knowledge, the first seque ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916253

8. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao M. Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

9. Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si
Published: 1/1/2015
Authors: Mark D Vaudin, William A Osborn, Lawrence H Friedman, Justin M Gorham, Robert Francis Cook, Victor Vartanian
Abstract: Patterned SiGe thin film structures, heteroepitaxially deposited on Si substrates, are investigated as potential reference standards to establish the accuracy of high resolution electron backscattered diffraction (HR-EBSD) strain measurement meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916087

10. Raman spectroscopy-enhanced IIT: In situ analysis of mechanically stressed polycrystalline Si thin films
Published: 7/8/2014
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: Exposed to mechanical stress, semiconductor materials may phase transform, resulting in changes of crystallographic structure and material properties, rather than deform by plastic flow. As a consequence, prediction of the state and distribution of s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915665



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