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You searched on: Author: robert cook Sorted by: date

Displaying records 1 to 10 of 66 records.
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1. In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films
Published: 4/19/2016
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: The pressure induced phase transitions of crystalline Si films was studied in situ under a Berkovich probe using the Raman spectroscopy-enhanced instrumented indentation technique. The observations suggested strain and time as important parameters in ...

2. Stochastic behavior of nanoscale dielectric wall buckling
Published: 3/16/2016
Authors: Lawrence H Friedman, Igor Levin, Robert Francis Cook
Abstract: The random buckling patterns of nanoscale dielectric walls are analyzed using a nonlinear multi-scale stochastic method that combines experimental measurements with simulations. The dielectric walls, approximately 200 nm tall and 20 nm wi ...

3. Assessing Electron Backscattered Diffraction and Confocal Raman Microscopy Strain Mapping Using Wedge-indented Si
Published: 2/17/2016
Authors: Lawrence H Friedman, Mark D Vaudin, Stephan J Stranick, Gheorghe Stan, Yvonne Beatrice Gerbig, William A Osborn, Robert Francis Cook
Abstract: The accuracy of electron backscattered diffraction (EBSD) and confocal Raman microscopy (CRM) for small-scale strain mapping are assessed using the multi-axial strain field surrounding a wedge indentation in Si as a test vehicle. The strain field is ...

4. In situ spectroscopic study of the plastic deformation of amorphous silicon under non-hydrostatic conditions
Published: 12/17/2015
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook, Jodie E. Bradby
Abstract: Indentation-induced plastic deformation of amorphous silicon (a-Si) thin films was studied by in situ Raman imaging of the deformed contact region of an indented sample, employing a Raman spectroscopy-enhanced instrumented indentation technique (IIT) ...

5. Heterogeneity and length scale effects in PEG-based hydrogels
Published: 8/10/2015
Authors: Brian G Bush, Jenna M Shapiro, Frank W DelRio, Robert Francis Cook, Michelle L. Oyen
Abstract: Colloidal-probe spherical indentation load-relaxation experiments are conducted on poly(ethylene glycol) (PEG) hydrogel materials to quantify the steady-state mechanical properties and time-dependent transport properties in a single experiment. A pr ...

6. Fracture strength of micro- and nano-scale silicon components
Published: 5/13/2015
Authors: Frank W DelRio, Robert Francis Cook, Brad Boyce
Abstract: Silicon devices are ubiquitous in many micro- and nano-scale technological applications, most notably microelectronics and microelectromechanical systems (MEMS). Despite their widespread usage, however, issues related to uncertain mechanical reliabi ...

7. In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films
Published: 2/14/2015
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman imaging of the deformed contact region of silicon, employing a Raman spectroscopy-enhanced instrumented indentation technique. This is, to our knowledge, the first seque ...

8. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao M. Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...

9. Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si
Published: 1/1/2015
Authors: Mark D Vaudin, William A Osborn, Lawrence H Friedman, Justin M Gorham, Robert Francis Cook, Victor Vartanian
Abstract: Patterned SiGe thin film structures, heteroepitaxially deposited on Si substrates, are investigated as potential reference standards to establish the accuracy of high resolution electron backscattered diffraction (HR-EBSD) strain measurement meth ...

10. Raman spectroscopy-enhanced IIT: In situ analysis of mechanically stressed polycrystalline Si thin films
Published: 7/8/2014
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: Exposed to mechanical stress, semiconductor materials may phase transform, resulting in changes of crystallographic structure and material properties, rather than deform by plastic flow. As a consequence, prediction of the state and distribution of s ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series