NIST logo

Publications Portal

You searched on:
Author: robert cook

Displaying records 41 to 49.
Resort by: Date / Title

41. Mechanical and electrical coupling at metal-insulator-metal nano-scale contacts
Published: 5/22/2008
Authors: Doo-In Kim, Pradeep Narayanan Namboodiri, Frank W DelRio, Robert Francis Cook
Abstract: Mechanical and electrical coupling at nano-scale metallic contacts was investigated using a conducting-probe atomic force microscope (AFM). The current-voltage responses were non-Ohmic, symmetric about zero bias, with conductance values smaller than ...

42. Origin of Adhesion in Humid Air
Published: 4/18/2008
Authors: Doo-In Kim, Jaroslaw Grobelny, Pradeep Narayanan Namboodiri, Robert Francis Cook
Abstract: The origin of adhesion at nanoscale contacts in humid air is investigated by pull-off force measurements using atomic force microscopes in controlled environments from ultra-high vacuum through various humidity conditions to water. An equivalent work ...

43. Giant Pop-Ins in Nanoindented Silicon and Germanium Caused by Lateral Cracking
Published: 2/1/2008
Authors: David John Oliver, Brian Ronald Lawn, Robert Francis Cook, M G Reitsma, J E Bradby, Juana S Williams, Paul Munroe

44. Diameter-Dependent Radial and Tangential Elastic Moduli of ZnO Nanowires
Published: 12/1/2007
Authors: Gheorghe Stan, C V Ciobanu, Prahalad M. Parthangal, Robert Francis Cook

45. Origin of Adhesion in Humid Air
Published: 11/12/2007
Authors: D -I Kim, Jaroslaw Grobelny, N Pradeep, Robert Francis Cook

46. Effect of topography and multi-asperity contacts on nano-scale elastic property measurements by atomic force acoustic microscopy,
Published: 9/1/2007
Authors: Gheorghe Stan, Robert Francis Cook

47. Measurement Science and Technology for Ceramics Innovations
Published: 7/31/2007
Authors: Debra L Kaiser, Robert Francis Cook
Abstract: Innovations in ceramic technologies are often driven by the discovery and introduction of a material with novel or improved behavior that enables realization of a superior component, device or system. Over the past few decades, advanced ceramic mater ...

48. Nanoindentation Behavior and Mechanical Properties Measurement of Polymeric Materials
Published: 5/1/2007
Authors: Robert Francis Cook, Michelle Oyen

49. Nanoparticle Lithography and Imaging Scanning Probe Microscopy
Published: 10/1/2006
Authors: Jaroslaw Grobelny, De-Hao D. Tsai, Doo-In Kim, Pradeep Narayanan Namboodiri, Robert Francis Cook, Michael Russel Zachariah
Abstract: Scanning tunnelling microscopy (STM) imaging was performed on goldsurfaces with a large coverage of monodispersed silver nanoparticlessoft-landed on the surface from the gas phase. In both ambient and ultra-highvacuum conditions, STM scanning was fou ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series