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Author: robert cook

Displaying records 41 to 50 of 56 records.
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41. Elastic Modulus of Faceted Aluminum Nitride Nanotubes Measured by Contact Resonance Atomic Force Microscopy
Published: 12/17/2008
Authors: Gheorghe Stan, C Ciobanu, Timothy Thayer, George Wang, Randall Creighton, Premsagar Purushotham Kavuri, Leonid A Bendersky, Robert Francis Cook
Abstract: A new methodology for determining the radial elastic modulus of a one-dimensional nanostructure laid on a substrate has been developed. The methodology consists of the combination of contact resonance atomic force microscopy (AFM) with finite element ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854145

42. Comparison of Nanoscale Measurements of Strain and Stress using Electron Back Scattered Diffraction and Confocal Raman Microscopy
Published: 12/12/2008
Authors: Mark D Vaudin, Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: Strains in Si as small as 104 (corresponding to stresses of 10 MPa) have been measured using electron back scatter diffraction (EBSD), with spatial resolution close to 10 nm, and confocal Raman microscopy (CRM) with spatial resolution app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854129

43. Indentation Fracture of Low Dielectric Constant Films, Part I. Experiments and Observations
Published: 12/12/2008
Authors: Dylan Morris, Robert Francis Cook
Abstract: Advanced microelectronic interconnection structures will need dielectrics of low permittivity to reduce capacitive delays and crosstalk; but this reduction in permittivity typically necessitates an increase in free volume of the material, which is fr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851099

44. Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy
Published: 11/13/2008
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853572

45. Indentation Fracture of Low Dielectric Constant Films, Part II. Indentation Fracture Mechanics Model
Published: 9/12/2008
Authors: Dylan Morris, Robert Francis Cook
Abstract: Part I of this two-part work explored the instrumented-indentation and fracture phenomena of compliant, low dielectric constant (low-k) films on silicon substrates. The effect of film thickness and probe acuity on the fracture response, as well as th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851100

46. Surface Effects on the Elastic Modulus of Te Nanowires
Published: 6/17/2008
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Mark D Vaudin, Leonid A Bendersky, Robert Francis Cook
Abstract: Nondestructive elastic property measurements have been performed on Te nanowires with diameters in the range 20 150 nm. By using contact resonance atomic force microscopy, the elastic indentation modulus perpendicular to the prismatic facets of the n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851078

47. Lateral force cantilever for precise atomic force microscope friction measurements
Published: 6/2/2008
Authors: Mark Reitsma, Richard Swift Gates, Robert Francis Cook
Abstract: We present a microfabricated atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope. The lateral force cantilever presented is equipped ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853564

48. Mechanical and electrical coupling at metal-insulator-metal nano-scale contacts
Published: 5/22/2008
Authors: Doo-In Kim, Pradeep Narayanan Namboodiri, Frank W DelRio, Robert Francis Cook
Abstract: Mechanical and electrical coupling at nano-scale metallic contacts was investigated using a conducting-probe atomic force microscope (AFM). The current-voltage responses were non-Ohmic, symmetric about zero bias, with conductance values smaller than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854471

49. Origin of Adhesion in Humid Air
Published: 4/18/2008
Authors: Doo-In Kim, Jaroslaw Grobelny, Pradeep Narayanan Namboodiri, Robert Francis Cook
Abstract: The origin of adhesion at nanoscale contacts in humid air is investigated by pull-off force measurements using atomic force microscopes in controlled environments from ultra-high vacuum through various humidity conditions to water. An equivalent work ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851021

50. Giant Pop-Ins in Nanoindented Silicon and Germanium Caused by Lateral Cracking
Published: 2/1/2008
Authors: David John Oliver, Brian Ronald Lawn, Robert Francis Cook, M G Reitsma, J E Bradby, Juana S Williams, Paul Munroe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854397



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