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Author: robert cook

Displaying records 11 to 20 of 51 records.
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11. Ultimate bending strength of Si nanowires
Published: 4/11/2012
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Igor Levin, Robert Francis Cook
Abstract: Test platforms for the ideal strength of materials are provided by almost defect-free nanostructures (nanowires, nanotubes, nanoparticles, for example). In this work, the ultimate bending strengths of Si nanowires with radii in the 20 nm to 60 nm r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910821

12. In situ observation of the indentation-induced phase transformation of silicon thin films
Published: 3/5/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman microspectroscopy of the deformed contact region of silicon on sapphire samples during contact loading and unloading. During loading, the formation of Si-II and another ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910047

13. Nanomechanical properties of polyethylene glycol brushes on gold substrates
Published: 2/15/2012
Authors: Gheorghe Stan, Frank W DelRio, Robert I. MacCuspie, Robert Francis Cook
Abstract: Brushes of polyethylene glycol (PEG) were directly anchored onto bare gold substrates in solution. The nucleation kinetics of PEG binding were investigated successively in solution and dry air using atomic force microscopy (AFM) imaging. In additio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906238

14. Deformation and fracture of single-crystal silicon theta-like specimens
Published: 10/28/2011
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Robert Francis Cook
Abstract: Miniaturized test specimens of single-crystal silicon, fabricated by lithography and deep reactive ion etching (DRIE), were used to measure deformation and fracture properties at the micro scale. Two specimen geometries, both in the form of a Greek l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908887

15. Micro-scale measurement and modeling of stress in silicon surrounding a tungsten-filled through-silicon via
Published: 10/11/2011
Authors: Ryan P. Koseski, William A Osborn, Stephan J Stranick, Frank W DelRio, Mark D Vaudin, Thuy Dao, Vance H. Adams, Robert Francis Cook
Abstract: The stress in silicon surrounding a tungsten-filled through-silicon via (TSV) is measured using confocal Raman microscopy line scans across the TSV both before and after etch removal of an oxide stack used as a mask to define the TSV during fabricati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908908

16. Prototype cantilevers for quantitative lateral force microscopy
Published: 9/27/2011
Authors: Mark Reitsma, Richard Swift Gates, Lawrence H Friedman, Robert Francis Cook
Abstract: Prototype cantilevers that enable quantitative micro- to nano-scale surface force measurements using contact-mode atomic force microscopy (AFM) are presented. The ,HammerheadŠ cantilevers allow precise optical lever system calibrations for cantilever ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907018

17. Structure-property relationships for methyl-terminated alkyl self-assembled monolayers
Published: 7/20/2011
Authors: Frank W DelRio, Dave Rampulla, Cherno Jaye, Gheorghe Stan, Richard Swift Gates, Daniel A Fischer, Robert Francis Cook
Abstract: Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure spectroscopy (NEXAFS) and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908238

18. Direct observation of phase transformation anisotropy in indented silicon using confocal Raman microscopy
Published: 5/31/2011
Authors: Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: The theoretically-predicted anisotropic nature of the indentation phase transformation in silicon (Si) is observed directly in experiments using hyperspectral, confocal Raman microscopy. The anisotropy is reflected in the two-dimensional distribution ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906105

19. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 1/1/2011
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). To start, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imagin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854151

20. Advanced Nanoscale Elastic Property Measurement by Contact-Resonance Atomic Force Microscopy
Published: 6/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: In atomic force microscopy (AFM)-based techniques, material information (topography, mechanical, electrical, magnetic, etc.) is retrieved from the nanoscale interaction between the AFM tip and the material probed. As the size of the apex of the AFM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905459



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