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Displaying records 11 to 20 of 61 records.
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11. On the bending strength of single-crystal silicon theta-like specimens
Published: 7/10/2013
Authors: Rebecca R. Kirkpatrick, William A Osborn, Michael S. Gaither, Richard Swift Gates, Frank W DelRio, Robert Francis Cook
Abstract: A new theta geometry was developed for micro-scale bending strength measurements. The new ,gapŠ theta specimen was a simple modification of the arch theta specimen that enabled micro-scale tensile testing. The gap theta was demonstrated here on sin ...

12. Etching process effects on surface structure, fracture strength, and reliability of single-crystal silicon theta-like specimens
Published: 5/30/2013
Authors: Michael S. Gaither, Richard Swift Gates, Rebecca R. Kirkpatrick, Robert Francis Cook, Frank W DelRio
Abstract: The etching processes used to produce microelectromechanical systems (MEMS) leave residual surface features that typically limit device strength and, consequently, device lifetime and reliability. In order to optimize MEMS device reliability, it is ...

13. Surface-Engineered Nanomaterials as X-ray Absorbing Adjuvant Agents for Auger-Mediated Chemo-Radiation
Published: 4/30/2013
Authors: Robert Francis Cook, Sang-Min Lee, De-Hao D. Tsai, Vincent A Hackley, Martin W. Brechbiel
Abstract: We demonstrate a prototype approach to formulate gold nanoparticle (AuNP)‹based X‹ray absorbing adjuvant agents through surface‹engineering of cisplatin pharmacophore (PtII) with lipoic acid‹modified polyacrylate (denoted as PtII‹AuNPs). Design of Pt ...

14. Accuracy and Resolution of Nanoscale Strain Measurement Techniques
Published: 3/26/2013
Authors: William A Osborn, Lawrence H Friedman, Mark D Vaudin, Stephan J Stranick, Michael S. Gaither, Justin M Gorham, Victor Vartanian, Robert Francis Cook

15. Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates
Published: 2/1/2013
Authors: Brian G Bush, Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The interfacial properties of n-alkylsilane self-assembled monolayers on silicon were investigated by normal force spectroscopy and lateral force measurements and correlated with molecular structure via near-edge X-ray absorption fine structure (NEXA ...

16. Indentation device for in situ Raman spectroscopic and optical studies
Published: 12/12/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, John W Hettenhouser, Walter Eric Byrd, Dylan J. Morris, Robert Francis Cook
Abstract: Instrumented indentation is a widely used technique to study the mechanical behavior of materials at small length scales and thus has been exploited in particular for metals, ceramics, glasses, and polymers. Mechanical tests of bulk materials, micros ...

17. High Confidence Level Calibration for AFM Based Fracture Testing of Nanobeams
Published: 6/11/2012
Authors: Scott Grutzik, Richard Swift Gates, Yvonne Beatrice Gerbig, Robert Francis Cook, Melissa Hines, Alan Zehnder
Abstract: When designing micro- or nanoelectromechanical systems, (MEMS and NEMS), it is important to consider whether structural elements will withstand loads experienced during operation. Fracture behavior at length scales present in MEMS and NEMS is much di ...

18. Nanoscale mapping of contact stiffness and damping by contact-resonance atomic force microscopy
Published: 5/3/2012
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: In this work, a new procedure is demonstrated to retrieve the conservative and dissipative contributions to contact-resonance atomic force microscopy (CR-AFM) measurements from the contact resonance frequency and resonance amplitude. By simultaneous ...

19. Ultimate bending strength of Si nanowires
Published: 4/11/2012
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Igor Levin, Robert Francis Cook
Abstract: Test platforms for the ideal strength of materials are provided by almost defect-free nanostructures (nanowires, nanotubes, nanoparticles, for example). In this work, the ultimate bending strengths of Si nanowires with radii in the 20 nm to 60 nm r ...

20. In situ observation of the indentation-induced phase transformation of silicon thin films
Published: 3/5/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman microspectroscopy of the deformed contact region of silicon on sapphire samples during contact loading and unloading. During loading, the formation of Si-II and another ...

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