NIST logo

Publications Portal

You searched on:
Author: robert cook

Displaying records 11 to 20 of 56 records.
Resort by: Date / Title


11. Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates
Published: 2/1/2013
Authors: Brian G Bush, Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The interfacial properties of n-alkylsilane self-assembled monolayers on silicon were investigated by normal force spectroscopy and lateral force measurements and correlated with molecular structure via near-edge X-ray absorption fine structure (NEXA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911464

12. Indentation device for in situ Raman spectroscopic and optical studies
Published: 12/12/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, John W Hettenhouser, Walter Eric Byrd, Dylan J. Morris, Robert Francis Cook
Abstract: Instrumented indentation is a widely used technique to study the mechanical behavior of materials at small length scales and thus has been exploited in particular for metals, ceramics, glasses, and polymers. Mechanical tests of bulk materials, micros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911470

13. High Confidence Level Calibration for AFM Based Fracture Testing of Nanobeams
Published: 6/11/2012
Authors: Scott Grutzik, Richard Swift Gates, Yvonne Beatrice Gerbig, Robert Francis Cook, Melissa Hines, Alan Zehnder
Abstract: When designing micro- or nanoelectromechanical systems, (MEMS and NEMS), it is important to consider whether structural elements will withstand loads experienced during operation. Fracture behavior at length scales present in MEMS and NEMS is much di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911026

14. Nanoscale mapping of contact stiffness and damping by contact-resonance atomic force microscopy
Published: 5/3/2012
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: In this work, a new procedure is demonstrated to retrieve the conservative and dissipative contributions to contact-resonance atomic force microscopy (CR-AFM) measurements from the contact resonance frequency and resonance amplitude. By simultaneous ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910667

15. Ultimate bending strength of Si nanowires
Published: 4/11/2012
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Igor Levin, Robert Francis Cook
Abstract: Test platforms for the ideal strength of materials are provided by almost defect-free nanostructures (nanowires, nanotubes, nanoparticles, for example). In this work, the ultimate bending strengths of Si nanowires with radii in the 20 nm to 60 nm r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910821

16. In situ observation of the indentation-induced phase transformation of silicon thin films
Published: 3/5/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman microspectroscopy of the deformed contact region of silicon on sapphire samples during contact loading and unloading. During loading, the formation of Si-II and another ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910047

17. Nanomechanical properties of polyethylene glycol brushes on gold substrates
Published: 2/15/2012
Authors: Gheorghe Stan, Frank W DelRio, Robert I. MacCuspie, Robert Francis Cook
Abstract: Brushes of polyethylene glycol (PEG) were directly anchored onto bare gold substrates in solution. The nucleation kinetics of PEG binding were investigated successively in solution and dry air using atomic force microscopy (AFM) imaging. In additio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906238

18. Deformation and fracture of single-crystal silicon theta-like specimens
Published: 10/28/2011
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Robert Francis Cook
Abstract: Miniaturized test specimens of single-crystal silicon, fabricated by lithography and deep reactive ion etching (DRIE), were used to measure deformation and fracture properties at the micro scale. Two specimen geometries, both in the form of a Greek l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908887

19. Micro-scale measurement and modeling of stress in silicon surrounding a tungsten-filled through-silicon via
Published: 10/11/2011
Authors: Ryan P. Koseski, William A Osborn, Stephan J Stranick, Frank W DelRio, Mark D Vaudin, Thuy Dao, Vance H. Adams, Robert Francis Cook
Abstract: The stress in silicon surrounding a tungsten-filled through-silicon via (TSV) is measured using confocal Raman microscopy line scans across the TSV both before and after etch removal of an oxide stack used as a mask to define the TSV during fabricati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908908

20. Prototype cantilevers for quantitative lateral force microscopy
Published: 9/27/2011
Authors: Mark Reitsma, Richard Swift Gates, Lawrence H Friedman, Robert Francis Cook
Abstract: Prototype cantilevers that enable quantitative micro- to nano-scale surface force measurements using contact-mode atomic force microscopy (AFM) are presented. The ,HammerheadŠ cantilevers allow precise optical lever system calibrations for cantilever ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907018



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series