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Author: steven brown

Displaying records 121 to 130 of 159 records.
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121. NIST Colorimetric Calibration Facility for Displays Colorimeters
Published: 1/1/1999
Authors: Steven W Brown, Yoshihiro Ohno
Abstract: A facility has been developed at the National Institute of Standards and Technology (NIST) to calibrate color-measuring instruments for displays. The instruments will be calibrated for measurements of cathode-ray tube (CRT) and flat panel displays ( ...

122. Radiometric Measurement Comparisons Using Transfer Radiometers in Support of the Calibration of NASA's Earth Observing System (EOS) Sensors, ed. by P.N. Slater
Published: 1/1/1999
Authors: James J. Butler, B L Markham, Bettye C Johnson, Steven W Brown, Howard W Yoon, R A Barnes, S F Biggar, E F Zalewski, P R Spyak, F Sakuma, Jill Cooper

123. Realization of a spectral radiance responsivity scale with a laser-based source and Si radiance meters
Published: 1/1/1999
Authors: George P Eppeldauer, Steven W Brown, Thomas C Larason, M Racz, R Lykke k

124. Four-color matrix method for correction of tristimulus colorimeters - Part 2
Published: 1/1/1998
Authors: Yoshihiro Ohno, Steven W Brown

125. NIST Reference Spectroradiometer for Color Display Calibrations
Published: 1/1/1998
Authors: Steven W Brown, Yoshihiro Ohno

126. Optical NMR from Single GaAs/AlGaAs Quantum Dots
Published: 1/1/1998
Authors: Steven W Brown, T A Kennedy, E R Glaser, D S Katzer

127. Optical NMR from Single Quantum Dots
Published: 1/1/1998
Authors: Steven W Brown, T A Kennedy, D Gammon

128. Nuclear Spectroscopy in Single Quantum Dots: Nanoscopic Raman Scattering and Nuclear Magnetic Resonance
Published: 1/1/1997
Authors: D Gammon, Steven W Brown, E S Snow, T A Kennedy, D S Katzer, D Park

129. Optical Spectroscopy of Single GaAs Quantum Dots
Published: 1/1/1997
Authors: D Gammon, Steven W Brown, T A Kennedy, E S Snow, B V Shanabrook, D S Katzer, D Park

130. Photospheric imaging of the RS CVn system HR 1099
Published: 1/1/1992
Authors: J F Donati, Steven W Brown, M Semel, D E Rees, Christopher E. Dempsey, J M Matthews, G W Henry, D S Hall

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
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