Journal of Research Volume 99

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

Precision comparison of the lattice parameters of silicon monocrystals, p. 1
Kessler, E.G.; Henins, A.; Deslattes, R.D.; Nielsen, L.; Arif, M.
http://dx.doi.org/10.6028/jres.099.002

The NIST 30 MHz linear measurement system, p. 19
Jargon, J.A.; Ginley, R.A.; Sutton, D.D.
http://dx.doi.org/10.6028/jres.099.003

Uncertainties in dimensional measurements made at nonstandard temperatures, p. 31
Swyt, D.A.
http://dx.doi.org/10.6028/jres.099.004

A null-balanced total-power radiometer system NCS1, p. 45
Pucic, S.P.
http://dx.doi.org/10.6028/jres.099.005

News briefs, p. 101
http://dx.doi.org/10.6028/jres.099.011

A sealed water calorimeter for measuring absorbed dose, p. 121
Domen, S.R.
http://dx.doi.org/10.6028/jres.099.012

Planar Near-Field Measurements of Low-Sidelobe Antennas, p. 143
Francis, M.H.; Newell, A.C.; Grimm, K.R.; Hoffman, J.; Schrank, H.E.
http://dx.doi.org/10.6028/jres.099.013

On the physics required for prediction of long term performance of polymers and their composites, p. 169
Mckenna, G.B.
http://dx.doi.org/10.6028/jres.099.014

The measurement and uncertainty of a calibration standard for the scanning electron microscope, p. 191
Fu, J.; Croarkin, M.C.; Vorburger, T.V.
http://dx.doi.org/10.6028/jres.099.015

Letter to the Editor: New values for silicon reference materials, certified for isotope abundance ratios, p. 201
Debievre, P.; Valkiers, S. Pesier, H.S.
http://dx.doi.org/10.6028/jres.099.016

News briefs, p. 203
http://dx.doi.org/10.6028/jres.099.017

Sources of uncertainty in a DVM-based measurement system for a quantized Hall resistance standard, p. 227
Lee, K.C.; Cage, M.E.; Rowe, P.S.
http://dx.doi.org/10.6028/jres.099.018

A dc method for the absolute determination of conductivities of the primary standard KCl solutions from 0°C to 50°C, p. 241
Wu, Y.C.; Koch, W.F.; Feng, D.; Holland, L.A.; Juhasz, E.; Arvay, E.; Tomek, A.
http://dx.doi.org/10.6028/jres.099.019

Three-axis coil probe dimensions and uncertainties during measurement of magnetic fields from appliances, p. 247
Misakian, M.; Fenimore, C.
http://dx.doi.org/10.6028/jres.099.020

Improved automated current control for standard lamps, p. 255
Walker, J.H.; Thompson, A.
http://dx.doi.org/10.6028/jres.099.021

Refractive indices of fluids related to alternative refrigerants, p. 263
Bruno, T.J.; Wood, M.A.; Hansen, B.N.
http://dx.doi.org/10.6028/jres.099.022

A theoretical analysis of the coherence-induced spectral shift experiments of Kandpal, Vaishya, and Joshi, p. 267
Foley, J.T.; Wang, M.
http://dx.doi.org/10.6028/jres.099.023

Wolf Shifts and their physical interpretation under laboratory conditions - comments on paper and author's reply, p. 281
Wolf, E.; Mielenz, K.D.
http://dx.doi.org/10.6028/jres.099.024

Erratum: Precision comparison of the lattice parameters of silicon monocrystals (Vol 99, Pg 1, 1994), p. 285
Kessler, E.G.; Henins, A.; Deslattes, R.D.; Nielsen, L.; Arif, M.
http://dx.doi.org/10.6028/jres.099.025

Workshop on characterizing diamond films III - Gaithersburg, Md - February 24-25, 1994, p. 287
Feldman, A.; Holly, S.; Klein, C.A.; Lu, G.
http://dx.doi.org/10.6028/jres.099.026

News briefs, p. 295
http://dx.doi.org/10.6028/jres.099.027

Extreme-value theory and applications: Proceedings of the Conference on Extreme-Value Theory and Applications, Volume II - Gaithersburg, Md - May-1993, Preface
Galambos, J.; Lechner, J.; Simiu, E.; Hagwood, C.
http://dx.doi.org/10.6028/jres.099.001

Applications of extreme-value theory in corrosion engineering, p. 313
Scarf, P.A.; Laycock, P.J.
http://dx.doi.org/10.6028/jres.099.028

On the requirements for a reasonable extreme-value prediction of maximum pits on hot-water-supply copper tubing, p. 321
Komukai, S.; Kasahara, K.
http://dx.doi.org/10.6028/jres.099.029

Application of extreme-value statistics to corrosion, p. 327
Shibata, T.
http://dx.doi.org/10.6028/jres.099.030

Exact solution to an interacting extreme-value problem: The pure-flaw model, p. 337
Leath, P.L.; Duxbury, P.M.
http://dx.doi.org/10.6028/jres.099.031

Inclusion rating by statistics of extreme values and its application to fatigue strength prediction and quality control of materials, p. 345
Murakami, Y.
http://dx.doi.org/10.6028/jres.099.032

Critical levels of ozone over the United-Kingdom: Mapping aggregate exceedances over moderate to high thresholds, p. 353
Smith, R.I.; Anderson, C.W.; Fowler, D.
http://dx.doi.org/10.6028/jres.099.033

Extreme-value estimation applied to aerosol size distributions and related environmental problems, p. 361
Hopke, P.K.; Paatero, P.
http://dx.doi.org/10.6028/jres.099.034

A trivariate extreme-value distribution applied to flood frequency analysis, p. 369
Escalantesandoval, C.A.; Raynalvillasenor, J.A.
http://dx.doi.org/10.6028/jres.099.035

Fractal theory and the estimation of extreme floods, p. 377
Turcotte, D.L.
http://dx.doi.org/10.6028/jres.099.036

Short-record-based extreme wind simulation, p. 391
Cheng, E.D.H.; Chiu, A.N.L.
http://dx.doi.org/10.6028/jres.099.037

Getting the most from your extreme wind data: A step by step guide, p. 399
Walshaw, D.
http://dx.doi.org/10.6028/jres.099.038

Application of an empirical extreme-value distribution to load models, p. 413
Kanda, J.
http://dx.doi.org/10.6028/jres.099.039

Seismic risk analysis based on strain energy accumulation in focal region, p. 421
Suzuki, M.; Ozaka, Y.
http://dx.doi.org/10.6028/jres.099.040

Techniques used to determine extreme wave heights from the NESS data set, p. 435
Maes, M.A.; Gu, G.Z.
http://dx.doi.org/10.6028/jres.099.041

Extreme-value analysis of wave heights, p. 445
Castillo, E.; Sarabia, J.M.
http://dx.doi.org/10.6028/jres.099.042

Dynamic amplification of Jack-up platforms subjected to non-Gaussian wave loads, p. 455
Jensen, J.J.
http://dx.doi.org/10.6028/jres.099.043

Prediction of extreme response of nonlinear oscillators subjected to random loading using the path integral solution technique, p. 465
Naess, A.
http://dx.doi.org/10.6028/jres.099.044

A random field excursion model of salt-induced concrete delamination, p. 475
Fenton, G.A.
http://dx.doi.org/10.6028/jres.099.045

Extreme-value theory applications to space radiation damage assessment in satellite microelectronics, p. 485
Marshall, P.W.; Dale, C.J.; Burke, E.A.
http://dx.doi.org/10.6028/jres.099.046

Performance comparison between a statistical model, a deterministic model, and an artificial neural network model for predicting damage from pitting corrosion, p. 495
Urquidi-Macdonald, M.; Macdonald, D.D.
http://dx.doi.org/10.6028/jres.099.047

Identification of failure origin through testing and the Weibull risk-of-rupture, p. 505
Tesk, J.A.; Chiang, M.Y.M.; Keeny, S.M; Tang, J.; Sato, Y.
http://dx.doi.org/10.6028/jres.099.048

Conical extremes of a multivariate sample, p. 511
Gnedin, A.V.
http://dx.doi.org/10.6028/jres.099.049

Bayesian forecasting of extreme values in an exchangeable sequence, p. 521
Hill, B.M.
http://dx.doi.org/10.6028/jres.099.050

On the convergence of the number of exceedances of nonstationary normal sequences, p. 539
Husler, J.; Kratz, M.
http://dx.doi.org/10.6028/jres.099.051

On the multivariate extremal index, p. 543
Nandagopalan, S.
http://dx.doi.org/10.6028/jres.099.052

Domains of attraction of multivariate extreme-value distributions, p. 551
Takahashi, R.
http://dx.doi.org/10.6028/jres.099.053

The aggregate excess measure of severity of extreme events, p. 555
Anderson, C.W.
http://dx.doi.org/10.6028/jres.099.054

The measurement of averages and extremes of environmental variables, p. 563
Anderson, C.W.; Turkman, K.F.
http://dx.doi.org/10.6028/jres.099.055

News briefs, p. 571
Anderson, C.W.; Turkman, K.F.
http://dx.doi.org/10.6028/jres.099.056

Tilt effects in optical angle measurements, p. 593
Queen, Y.H.
http://dx.doi.org/10.6028/jres.099.057

Optical characterization in microelectronics manufacturing, p. 605
Perkowitz, S.; Seiler, D.G.; Duncan, W.M.
http://dx.doi.org/10.6028/jres.099.058

Critical issues in scanning electron microscope metrology, p. 641
Postek, M.T.
http://dx.doi.org/10.6028/jres.099.059

Quest for Excellence VI - Gaithersburg, Md - February 7-9, 1994, p. 673
Parrott, C.; Chapman, R.E.
http://dx.doi.org/10.6028/jres.099.060

Sixteenth National Computer Security Conference - Baltimore, Md - September 20-23, 1993, p. 681
Gilbert, D.
http://dx.doi.org/10.6028/jres.099.061

Systems integration needs of United States manufacturers - Gaithersburg, Md - August 16-17, 1993, p. 687
Stewart, S.L.; Pinholster, G.
http://dx.doi.org/10.6028/jres.099.062

News briefs, p. 695
http://dx.doi.org/10.6028/jres.099.063

An intercomparison between NPL (India) and NIST (USA) pressure standards in the hydraulic pressure region up to 26 Mpa, p. 725
Sharma, J.K.N.; Jain, K.K.; Ehrlich, C.D.; Houck, J.C.; Ward, D.B.
http://dx.doi.org/10.6028/jres.099.064

Intercomparison of the ITS-90 radiance temperature scales of the National Physical Laboratory (U.K.) and the National Institute of Standards and Technology, p. 731
Machin, G.; Johnson, B.C.; Gibson, C; Rusby, R.L.
http://dx.doi.org/10.6028/jres.099.065

Screened-room measurements on the NIST spherical dipole standard radiator, p. 737
Koepke, G.; Randa, J.
http://dx.doi.org/10.6028/jres.099.066

Beamcon III, a linearity measurement instrument for optical detectors, p. 751
Thompson, A.; Chen, H.M.
http://dx.doi.org/10.6028/jres.099.067

Spectroscopic study of quantized breakdown voltage states of the quantum Hall effect, p. 757
Lavine, C.F.; Cage, M.E.; Elmquist, R.E.
http://dx.doi.org/10.6028/jres.099.068

Workshop on Critical Issues in Air Ultraviolet metrology - Gaithersburg, Md - May 26-27, 1994, p. 765
Thompson, A.; Hobish, M.K.
http://dx.doi.org/10.6028/jres.099.069

Data Administration Management Association Symposium - Gaithersburg, Md - May 17-18, 1994, p. 775
Newton, J.
http://dx.doi.org/10.6028/jres.099.070

North American Integrated Services Digital Network (ISDN) Users Forum (NIUF) - Gaithersburg, Md - June 21-24, 1994, p. 777
Lennon, E.B.
http://dx.doi.org/10.6028/jres.099.071

Compass '94, Ninth Annual Conference on Computer Assurance - Gaithersburg, Md - June 27 July 1, 1994, p. 781
Ippolito, L.M.; Wallace, D.R.; Lennon, E.B.
http://dx.doi.org/10.6028/jres.099.072

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

Journal of Research of NIST

Volume 99

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January 1994

Issue 2 March 1994

Issue 3 May 1994

Issue 4 July 1994

Issue 5 September 1994

Issue 6 November 1994

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