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Nanomanufacturing Portal

Programs and Projects
Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Forensic Topography and Surface Metrology

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Nanoelectronic Device Metrology

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

Advanced Linear and Nonlinear Optical Properties of Materials

High-accuracy linear and nonlinear optical properties of materials used for leading-edge optical technologies are measured and characterized to … more

Nanoparticle Tracking for Fluidic Self Assembly (Archived)

One challenge of nanomanufacturing is to establish methods to assemble solution-based nanoparticles into organized structures with nanometer … more

Directed Self-Assembly of Block Copolymers (Archived)

One of the major obstacles to incorporating nanotechnology into everyday products is the difficulty of making nanoscale structures inexpensively … more

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General Information:
301-975-NIST (6478)
inquiries@nist.gov

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Gaithersburg, MD 20899-1070