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Programs and Projects
Nanoelectronic Device Metrology

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

Atom-Based Dimensional Metrology

To fabricate and measure solid state implementations of manufacturable atomically precise devices. Build the infrastructure to fabricate prototype … more

Traceable Scanning Probe Nano-Characterization

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Forensic Topography and Surface Metrology

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Novel Sources for Focused-ion Beams

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. In the CNST, researchers are … more

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