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The CM300FEG is a Transmission Electron Microscope equipped with spectroscopic detectors to allow chemical, elemental, and other analytical measurements to be performed at high spatial resolution. The CM300 operates between 100 keV and 300 keV electron beam energy, and uses a thermal (Schottky) field emission electron source to illuminate the sample. It can be used in full-field imaging mode as both a conventional TEM and a phase-contrast high resolution TEM for imaging the atomic scale lattice in many materials. It can also be used as a high resolution scanning transmission electron microscope (STEM), where a finely focused electron beam is scanned across the sample and an image is forming using one of several available electron or spectroscopic signals. This latter mode is particularly useful for performing elemental and chemical analyses of very small analytical volumes. The above capabilities are supplemented by a full suite of electron diffraction capabilities, including selected area electron diffraction (SAED) and convergent beam electron diffraction (CBED). These diffraction modalities allow the instrument to probe the crystallographic phase and microstructure of samples in addition to their structural and chemical properties.
Specifications / Capabilities:
* up to 300 keV electron beam energy
Scientific Opportunities / Applications:
* tomographic and 3D elemental distributions
* 3D Chemical Imaging at the Nanoscale