The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more
Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more
The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more
The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging … more
This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of … more
This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more
NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics
NIST Polishes Method for Creating Tiny Diamond Machines
NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
New Wave: Spin Soliton Could Be a Hit in Cell Phone Communication
Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals
A high-bandwidth electromagnetic MEMS motion stage for scanning applications
In Situ Gas Phase Diagnostics for Titanium Nitride Atomic Layer Deposition
General Information: 301-975-NIST (6478) inquiries@nist.gov
100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070
