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Catching Waves: Measuring Self-Assembly in Action
Release Date: 06/21/2007

By making careful observations of the growth of a layer of molecules as they gradually cover the surface of a small silicon rectangle, researchers … more

New Measurement Guide Worth ‘Poring Over’
Release Date: 11/09/2006

In industries from textiles to automobiles and from pharmaceuticals to semiconductors, accurately measuring empty spaces—technically speaking, … more

New X-Ray Microbeam Answers 20-Year-Old Metals Question submicron xray beam
Release Date: 08/03/2006

Novel 3-D microbeam experiment enables direct proof of the Mughrabi model of metal stress. Submicron X-ray beam (broad arrow) penetrates a … more

Soft Materials Buckle Up for Measurement
Release Date: 06/22/2006

NIST researchers developed a new high-speed method for measuring the stiffness of soft-polymer materials like those used in contact lenses. The … more

Designer Gradients Speed Surface Science Experiments
Release Date: 06/08/2006

Researchers from the National Institute of Standards and Technology (NIST) have demonstrated an elegantly simple technique for synthesizing a wide … more

Mass Spectrometry Methods Database Gets Major Update
Release Date: 05/25/2006

Researchers at the National Institute of Standards and Technology (NIST) recently added 150 new methods—nicknamed "recipes"—to a database already … more

Boettinger Elected to Engineering Academy
Release Date: 02/16/2006

National Institute of Standards and Technology (NIST) metallurgist William J. Boettinger has been elected to the National Academy of Engineering … more

Stable Polymer Nanotubes May Have a Biotech Future
Release Date: 02/02/2006

Scientists at the National Institute of Standards and Technology (NIST) have created polymer nanotubes that are unusually long (about 1 … more

Measurement and Standards Issues in Nanobiotechnology
Release Date: 12/22/2005

The National Institute of Standards and Technology (NIST) will co-host a workshop to discuss needed measurement technologies and standards in the … more

A New Structural View of Organic Electronic Devices
Release Date: 09/09/2005

Although still in the qualifying rounds, U.S. researchers are helping manufacturers win the race to develop low-cost ways to commercialize a … more

Reference Materials Planned for Semiconductor Industry
Release Date: 06/30/2005

Companies and research organizations are invited to collaborate with the National Institute of Standards and Technology (NIST) and SEMATECH in the … more

'Metal-Decorated' Nanotubes Hold Promise for Fuel Cells
Release Date: 05/03/2005

This computer model shows how titanium atoms (dark blue) can attach above the centers of single-walled carbon nanotubes (light blue). Quantum … more

NIST Testing Method Quickly Tells Whether Thin Films Are Strong Enough for the Job
Release Date: 07/12/2004

The challenge of determining whether thin films—some no thicker than a single molecule—are strong enough for a growing number of important … more

NIST Team Reports Method to Characterize New Insulating Materials for Microelectronics
Release Date: 08/20/2002

Researchers from the Commerce Department's National Institute of Standards and Technology (NIST) reported today they have developed methods for … more

NIST Materials Science Pioneer John Cahn To Receive Bower Award from Franklin Institute
Release Date: 01/28/2002

The Department of Commerce's National Institute of Standards and Technology (NIST) announced today that materials scientist John Cahn will receive … more

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