Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Anthony B. Kos; Jason P. Killgore; Donna C. Hurley;|
|Title:||SPRITE: A modernized approach to scanning probe contact resonance imaging|
|Published:||January 20, 2014|
|Abstract:||We describe a system for contact resonance tracking called Scanning Probe Resonance Image Tracking Electronics (SPRITE). SPRITE can image two contact resonance frequencies simultaneously and thus can be used to acquire quantitative mechanical properties without requiring tedious image registration or other forms of post-processing. SPRITE is up to ten times faster than its predecessor, and its use of digital frequency synthesis means that the frequency is 100 times more precise. In addition, SPRITE can acquire quality factor images, which can be used to determine viscoelastic material properties. The resonant frequency of two eigenmodes and two corresponding quality facotr images can be acquired simultaneously. These new features can enable accurate nanomechanical imagign of surfaces and devices.|
|Citation:||Measurement Science and Technology|
|Pages:||pp. 1 - 9|
|Keywords:||atomic force acoustic microscopy,atomic force microscope,contact resonance spectroscopy,digital signal processor,elastic modulus,nanomechanics,rms-to-dc converter,scanning probe microscopy|
|Research Areas:||Instrumentation, Atomic force microscopy (AFM)|