SPRITE: A modernized approach to scanning probe contact resonance imaging

Published

January 20, 2014

Author(s)

Anthony B. Kos, Jason P. Killgore, Donna C. Hurley

Abstract

We describe a system for contact resonance tracking called Scanning Probe Resonance Image Tracking Electronics (SPRITE). SPRITE can image two contact resonance frequencies simultaneously and thus can be used to acquire quantitative mechanical properties without requiring tedious image registration or other forms of post-processing. SPRITE is up to ten times faster than its predecessor, and its use of digital frequency synthesis means that the frequency is 100 times more precise. In addition, SPRITE can acquire quality factor images, which can be used to determine viscoelastic material properties. The resonant frequency of two eigenmodes and two corresponding quality facotr images can be acquired simultaneously. These new features can enable accurate nanomechanical imagign of surfaces and devices.

Citation

Measurement Science and Technology

Volume

25

Issue

025405

Pub Type

Journals

Keywords

atomic force acoustic microscopy, atomic force microscope, contact resonance spectroscopy, digital signal processor, elastic modulus, nanomechanics, rms-to-dc converter, scanning probe microscopy

Citation

Kos, A. , Killgore, J. and Hurley, D. (2014), SPRITE: A modernized approach to scanning probe contact resonance imaging, Measurement Science and Technology (Accessed October 2, 2026)

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