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|Author(s):||Robert R. Keller;|
|Title:||What's in a 'NYM?|
|Published:||July 01, 2013|
|Abstract:||The field of electron microscopy, by its very diverse nature, abounds with acronyms: AEM, EF-TEM, ESEM, FE-SEM, HREM, HRTEM, HVEM, SEM, STEM, TEM, and VP-SEM, to name some instruments alone. Add in the different forms of data that these instruments might collect, and it can overwhelm some: ADF, BF, BSE, CBED, CL, DF, EBIC, EBSD/BEKP/BKD/EBSP, ECCI, EDS/EDX, EELS, HAADF, NBD, SAD, and SE, to mention some popular ones. For the brave reader, check out the acronym listing at the beginning of DB Williams and CB Carter, ,Transmission Electron MicroscopyŠ vol. I, Plenum, 1996! How do we microscopists and microscope users (this difference may be a separate opinion item,) come up with these acronyms?|
|Pages:||pp. 72 - 72|
|Keywords:||acronyms, electron backscatter diffraction, opinion,|
|Research Areas:||Electron microscopy (EM, TEM, SEM, STEM)|
|PDF version:||Click here to retrieve PDF version of paper (269KB)|