Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Combinatorial Coverage Measurement Concepts and Applications

NIST Authors in Bold

Author(s): David R. Kuhn; Itzel (. Dominquez Mendoza; Raghu N. Kacker; Yu Lei;
Title: Combinatorial Coverage Measurement Concepts and Applications
Published: March 22, 2013
Abstract: Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures of combinatorial coverage that can be used in evaluating aspects of t-way coverage of a test suite. We also provide lower bounds on t-way coverage of several widely-used testing strategies, and describe a tool that analyzes test suites using the measures discussed in the paper.
Conference: Second International Workshop on Combinatorial Testing
Proceedings: Proceedings of the Sixth IEEE International Conference on Software, Testing, Verification and Validation (ICST 2013)
Pages: pp. 352 - 361
Location: Luxembourg, -1
Dates: March 18-22, 2013
Keywords: component, combinatorial testing, factor covering array, state-space coverage, verification and validation (V&V), tway testing, configuration model, t-way testing
Research Areas: Computer Security, Conformance Testing
DOI: http://dx.doi.org/10.1109/ICSTW.2013.77  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (760KB)