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|Author(s):||David R. Kuhn; Itzel (. Dominquez Mendoza; Raghu N. Kacker; Yu Lei;|
|Title:||Combinatorial Coverage Measurement Concepts and Applications|
|Published:||March 22, 2013|
|Abstract:||Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures of combinatorial coverage that can be used in evaluating aspects of t-way coverage of a test suite. We also provide lower bounds on t-way coverage of several widely-used testing strategies, and describe a tool that analyzes test suites using the measures discussed in the paper.|
|Conference:||Second International Workshop on Combinatorial Testing|
|Proceedings:||Proceedings of the Sixth IEEE International Conference on Software, Testing, Verification and Validation (ICST 2013)|
|Pages:||pp. 352 - 361|
|Dates:||March 18-22, 2013|
|Keywords:||component, combinatorial testing, factor covering array, state-space coverage, verification and validation (V&V), tway testing, configuration model, t-way testing|
|Research Areas:||Conformance Testing, Computer Security|
|DOI:||http://dx.doi.org/10.1109/ICSTW.2013.77 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (760KB)|