| Author(s): |
Michael T. Postek; Mary B. Satterfield; Bradley N. Damazo; Robert Gordon; |
| Title: |
Microscopy for STEM Educators |
| Published: |
May 21, 2012 |
| Abstract: |
The future of our nation hinges on our ability to prepare our next generation to be innovators in science, technology, engineering and math (STEM). Excitement for STEM must begin at the earliest stages of our education process. Yet, today far too few of our students are prepared for the challenges ahead. Several initiatives are trying to change this situation. “Microscopy for STEM Educators” was an initiative that demonstrated the value of incorporating microscopy into STEM education. Several notable invited speakers discussed their successful programs implementing microscopy in STEM education in order to foster student interest and excitement. A hands-on session with table-top scanning electron microscopes was held at the end of the presentations and the attendees were encouraged to bring samples of interest and operate the instruments. This paper outlines some of the goals of this session. |
| Proceedings: |
SPIE Proceedings of the Defense Sensing and Security - SCANNING Microscopy |
| Volume: |
8378 |
| Pages: |
pp. no page # - no page # |
| Location: |
Baltimore, MD |
| Dates: |
April 23-27, 2012 |
| Keywords: |
STEM; science; technology; engineering; math; microscopy; SEM; scanning electron microscope; NNI; nanotechnology |
| Research Areas: |
Nanotechnology |
