NIST Authors in Bold
| Author(s): | Jifeng Qu; Samuel P. Benz; Yang Fu; Jianqiang Zhang; Horst Rogalla; Alessio Pollarolo; |
|---|---|
| Title: | Flat frequency response in the electronic measurement of the Boltzmann constant |
| Published: | July 01, 2012 |
| Abstract: | A new quantum voltage calibrated Johnson noise thermometer (JNT) was developed at NIM to demonstrate the electrical approach that determines the Boltzmann constant k by comparing electrical and thermal noise power. A measurement with integration period of 10 hours and bandwidth of 640 kHz results in relative offset of 0.5106 from the current CODATA value of k, and type A relative standard uncertainty of 23106. The quadratic fitting parameters of the ratio spectrum show a flat frequency response with respect to the measurement bandwidth. This flat response is a dramatic improvement compared to the response produced by the NIST JNT system that dominated the relative combined uncertainty of previous measurements of k. |
| Conference: | Conference on Precision Electromagnetic Measurements |
| Proceedings: | Conference on Precision Electromagnetic Measurements Conference Digest |
| Volume: | 28 |
| Pages: | pp. 216 - 217 |
| Location: | National Harbor, MD |
| Dates: | July 1-6, 2012 |
| Keywords: | Boltzmann equation; Correlation; Digital-analog conversion; Josephson arrays; Measurement units; Noise Measurement; Quantization; Signal synthesis; Standards; Temperature |
| Research Areas: | Instrumentation, Quantum Devices, Quantum Electrical Measurements, Measurements |
| DOI: | 10.1109/CPEM.2012.6250879 (Note: May link to a non-U.S. Government webpage) |
| PDF version: | Click here to retrieve PDF version of paper (203KB) |