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Publication Citation: Characteristics of Graphene for Quantized Hall Effect Measurements

NIST Authors in Bold

Author(s): Randolph E. Elmquist; Mariano A. Real; Irene G. Calizo; Brian G. Bush; Tian T. Shen; Nikolai N. Klimov; David B. Newell; Angela R. Hight Walker; Randall M. Feenstra;
Title: Characteristics of Graphene for Quantized Hall Effect Measurements
Published: June 01, 2012
Abstract: This paper describes concepts and measurement techniques necessary for characterization of graphene in the development of graphene-based quantized Hall effect (QHE) devices and resistance standards. We briefly contrast the properties of graphene produced by three common processing methods and discuss the conditions necessary for well-developed resistance plateaus to be observed. Methods used to determine the graphene layer thickness are presented. These metrologically relevant characteristics of graphene are correlated with electrical transport measurements in strong magnetic fields.
Conference: Conference on Precision Electromagnetic Measurements 2012
Proceedings: CPEM 2012 Conference Digest
Pages: pp. 514 - 515
Location: Washington, DC
Dates: July 2-6, 2012
Keywords: Electrical resistance measurements, graphene, material properties, measurement standards, quantum Hall effect
Research Areas: Electron Physics
PDF version: PDF Document Click here to retrieve PDF version of paper (219KB)