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|Author(s):||Joel C. Weber;|
|Title:||Microwave near-field probes for photovoltaic applications|
|Published:||June 19, 2011|
|Abstract:||The photoresponse of three different photovoltaic Cu(In, Ga)Se2 (CIGS) samples as well as GaAs and silicon bulk samples is measured using near-field scanning microwave microscopy (NSMM). Modeling predicts light-dependent conductivity values for bulk samples, as well as a preliminary understanding of more complicated multilayer photovoltaics. The spectral dependence of CIGS samples is probed at 405, 635, 808 and 980 nm wavelengths. In addition, we present two-dimensional raster scans that may reveal grain-boundary effects under illumination.|
|Proceedings:||37th IEEE Photovoltaic Specialists Conference|
|Pages:||pp. 1978 - 1982|
|Dates:||June 19-24, 2011|
|Keywords:||microwave scanning probes, near-field scanning microwave microscopy, photovoltaic materials, radio- frequency scanning tunneling microscopy, solar cell, CIGS, GaAs|
|Research Areas:||Microwave Measurement Services, Optoelectronics|
|DOI:||http://dx.doi.org/10.1109/PVSC.2011.6186341 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (593KB)|