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Publication Citation: Microwave near-field probes for photovoltaic applications

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Author(s): Joel C. Weber;
Title: Microwave near-field probes for photovoltaic applications
Published: June 19, 2011
Abstract: The photoresponse of three different photovoltaic Cu(In, Ga)Se2 (CIGS) samples as well as GaAs and silicon bulk samples is measured using near-field scanning microwave microscopy (NSMM). Modeling predicts light-dependent conductivity values for bulk samples, as well as a preliminary understanding of more complicated multilayer photovoltaics. The spectral dependence of CIGS samples is probed at 405, 635, 808 and 980 nm wavelengths. In addition, we present two-dimensional raster scans that may reveal grain-boundary effects under illumination.
Proceedings: 37th IEEE Photovoltaic Specialists Conference
Pages: pp. 1978 - 1982
Location: Seattle, WA
Dates: June 19-24, 2011
Keywords: microwave scanning probes; near-field scanning microwave microscopy; photovoltaic materials; radio- frequency scanning tunneling microscopy; solar cell; CIGS; GaAs
Research Areas: Microwave Measurement Services, Optoelectronics
DOI: http://dx.doi.org/10.1109/PVSC.2011.6186341  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (593KB)