NIST logo

Publication Citation: Development of a Seebeck Coefficient Standard Reference Material (SRM),

NIST Authors in Bold

Author(s): Nathan Lowhorn; Winnie K. Wong-Ng; John Lu; Joshua B. Martin; Martin L. Green; John E. Bonevich; Evan L. Thomas; Neil Dilley; Jeff Sharp;
Title: Development of a Seebeck Coefficient Standard Reference Material (SRM),
Published: August 01, 2011
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM,), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential steady-state (DC) technique on 10 samples (15 measurements)randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 K to 390 K and they are further supported by transient (AC) measurements. The availability of this SRM will validate measurement results, leading to a better understanding of structure/property relationships and the underlying physics of potential high efficiency thermoelectric materials.
Citation: Journal of Materials Research
Volume: 26
Issue: 15
Pages: pp. 1983 - 1992
Keywords: Low temperature Seebeck coefficient SRM; bismuth telluride; Steady-state (DC) technique; certification; instrument calibration
Research Areas: Energy
DOI: http://dx.doi.org/10.1557/jmr.2011.118  (Note: May link to a non-U.S. Government webpage)