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|Author(s):||Nathan Lowhorn; Winnie K. Wong-Ng; John Lu; Joshua B. Martin; Martin L. Green; John E. Bonevich; Evan L. Thomas; Neil Dilley; Jeff Sharp;|
|Title:||Development of a Seebeck Coefficient Standard Reference Material (SRM),|
|Published:||August 01, 2011|
|Abstract:||We have successfully developed a Seebeck coefficient Standard Reference Material (SRM,), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential steady-state (DC) technique on 10 samples (15 measurements)randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 K to 390 K and they are further supported by transient (AC) measurements. The availability of this SRM will validate measurement results, leading to a better understanding of structure/property relationships and the underlying physics of potential high efficiency thermoelectric materials.|
|Citation:||Journal of Materials Research|
|Pages:||pp. 1983 - 1992|
|Keywords:||Low temperature Seebeck coefficient SRM, bismuth telluride, Steady-state (DC) technique, certification, instrument calibration|
|DOI:||http://dx.doi.org/10.1557/jmr.2011.118 (Note: May link to a non-U.S. Government webpage)|