| Author(s): |
Nathan Lowhorn; Winnie K. Wong-Ng; John Lu; Joshua B. Martin; Martin L. Green; John E. Bonevich; Evan L. Thomas; Neil Dilley; Jeff Sharp; |
| Title: |
Development of a Seebeck Coefficient Standard Reference Material (SRM)™ |
| Published: |
August 01, 2011 |
| Abstract: |
We have successfully developed a Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential steady-state (DC) technique on 10 samples (15 measurements)randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 K to 390 K and they are further supported by transient (AC) measurements. The availability of this SRM will validate measurement results, leading to a better understanding of structure/property relationships and the underlying physics of potential high efficiency thermoelectric materials. |
| Citation: |
Journal of Materials Research |
| Volume: |
26 |
| Issue: |
15 |
| Pages: |
pp. 1983 - 1992 |
| Keywords: |
Low temperature Seebeck coefficient SRM; bismuth telluride; Steady-state (DC) technique; certification; instrument calibration |
| Research Areas: |
Energy |
| DOI: |
10.1557/jmr.2011.118 (Note: May link to a non-U.S. Government webpage) |
