NIST Authors in Bold
| Author(s): | Paul D. Hale; Jeffrey A. Jargon; Chih-Ming Wang; Brett Grossman; Matthew Claudius; Jose Torres; Andrew M. Dienstfrey; Dylan F. Williams; |
|---|---|
| Title: | A statistical study of de-embedding applied to eye diagram analysis |
| Published: | February 01, 2012 |
| Abstract: | We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any associated cables and test fixtures. We demonstrate the effectiveness of the method by performing a statistical analysis of the calculated eye height and eye width obtained from a controlled experiment consisting of multiple cable lengths, bit rates, and oscilloscope samplers. We also demonstrate our approach by measuring the transmission through test device consisting of two short lengths of cable, a ball-grid array and complicated circuit board. |
| Citation: | IEEE Transactions on Instrumentation and Measurement |
| Volume: | 61 |
| Issue: | 2 |
| Pages: | pp. 475 - 488 |
| Keywords: | deconvolution; de-embedding; eye diagram; eye pattern; inverse problems; regularization |
| Research Areas: | Optical Metrology, Electronics & Telecommunications, Measurements |
| PDF version: | Click here to retrieve PDF version of paper (543KB) |