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NIST Authors in Bold
|Author(s):||Yaw S. Obeng; Eric D. Simmon; YaShian Li-Baboud;|
|Title:||US Anti-Counterfeiting Standards Development Activities: An Overview|
|Published:||December 01, 2010|
|Abstract:||Counterfeit electronics components impact performance, hence can be viewed as a reliability concern. Several different strategies have been proposed to mitigate the penetration and impact of counterfeits on the supply chain. Standards afford effective platforms for education and harmonizing practices the supply chain in the fight against counterfeits. In this presentation, we will describe the product brand protection landscape and discuss the ongoing standards development efforts in the USA. After initially screening the ongoing work of standard development organizations (SDOs), we will review in some detail the standards development work currently going on within NIST and at SAE.|
|Keywords:||Anti-Counterfeiting, standards development|