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Publication Citation: Wafer-level Hall Measurement on SiC MOSFET

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Author(s): Liangchun Yu; Kin P. Cheung; Vinayak Tilak; Greg Dunne; Kevin Matocha; Jason P. Campbell; John S. Suehle; Kuang Sheng;
Title: Wafer-level Hall Measurement on SiC MOSFET
Published: October 16, 2009
Abstract:
Pages: 30 pp.
Research Areas: Semiconductors