Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Femtotesla atomic magnetometry in a microfabricated vapor cell

NIST Authors in Bold

Author(s): William C. Griffith; Svenja A. Knappe; John E. Kitching;
Title: Femtotesla atomic magnetometry in a microfabricated vapor cell
Published: December 20, 2010
Abstract: We describe an optically pumped 87Rb magnetometer with 4.5 fT/Hz1/2 sensitivity when operated in the spin-exchange relaxation free (SERF) regime. The magnetometer uses a microfabricated vapor cell, consisting of a cavity etched in a 1 mm thick silicon wafer with anodically bonded pyrex windows. The measurement volume of the magnetometer is 1 mm3, defined by the overlap region of a circularly polarized pump laser, and a linearly polarized probe laser, both operated near 795 nm. Sensitivity limitations unique to the use of microfabricated cells are discussed.
Citation: Optics Express
Volume: 18
Pages: pp. 27167 - 27172
Keywords: atomic magnetometer,CSAM,microfabricated magnetometer
Research Areas: Physics, Atomic Physics
PDF version: PDF Document Click here to retrieve PDF version of paper (877KB)