NIST logo

Publication Citation: Quantum information processing and metrology with trapped ions

NIST Authors in Bold

Author(s): David J. Wineland; Dietrich G. Leibfried;
Title: Quantum information processing and metrology with trapped ions
Published: January 25, 2011
Abstract: The use of trapped atomic ions in the field of quantum information processing is briefly reviewed. We summarize the basic mechanisms required for logic gates and the use of the gates in demonstrating simple algorithms. We discuss the potential of trapped ions to reach fault-tolerant error levels in a large-scale system, and highlight some of the problems that will be faced in achieving this goal. Possible near-term applications in applied and basic science, such as in metrology and quantum simulation, are briefly discussed.
Citation: Laser Physics Letters
Volume: 8
Issue: 3
Pages: pp. 175 - 188
Keywords: coherent quantum control;quantum information processing;quantum state control;trapped ions
Research Areas: Quantum Information, Quantum Computing/Quantum Computation, Physics, Quantum Information Technology, Ion Trapping
PDF version: PDF Document Click here to retrieve PDF version of paper (422KB)