NIST Authors in Bold
| Author(s): | Brad Conrad; Calvin Chan; Marsha A. Loth; Sean R. Parkin; Xinran Zhang; John E. Anthony; David J. Gundlach; |
|---|---|
| Title: | Characterization of a Soluble Anthradithiophene Derivative |
| Published: | October 01, 2010 |
| Abstract: | The structural and electrical properties of a new solution processable material, 2,8-diflouro-5,11-tert-butyldimethylsilylethynl anthradithiophene (TBDMS), were measured for single crystal and spun cast thin-film transistors. TBDMS is observed to readily form single crystals with a maximum observed saturation mobility µS of 0.07cm2/Vs, current on-off ratios Ion/Ioff >107, and subthreshold slopes S ~1dec/V. A previously unreported novel columnar stacking crystal structure, with a π/4 radian rotational offset between neighboring molecules, is observed in TBDMS crystals. Electronic current noise in the single crystal TBDMS-TFTs is found to vary inversely with gate voltage, suggesting a mobility fluctuation generation mechanism. |
| Citation: | Applied Physics Letters |
| Volume: | 97 |
| Pages: | pp. 133306-1 - 133306-3 |
| Keywords: | device; single crystal; organic; transistor; noise; TFT; AFM |
| Research Areas: | Semiconductors, Characterization, Semiconductor Materials, Atomic force microscopy (AFM), Academic, Physics, Characterization, Nanometrology, and Nanoscale Measurements, Device Design and Characterization |
| PDF version: | Click here to retrieve PDF version of paper (371KB) |