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|Author(s):||Howard W. Yoon; David W. Allen; George P. Eppeldauer; Benjamin K. Tsai;|
|Title:||The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm|
|Published:||August 21, 2009|
|Abstract:||Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility are described. The determination of bi-directional reflectance factor with low uncertainties requires the exInGaAs radiometer to be characterized for low-noise performance, linearity and spatial uniformity. The instrument characterizations will be used to establish a total uncertainty budget for the reflectance factor. To independently check the bi-directional reflectance factors, measurements also were made in a separate facility in which the reflectance factor is determined using calibrated spectral irradiance and radiance standards. The total combined uncertainties for the diffuse reflectances range from < 1 % at 1100 nm to 2.5 % at 2500 nm. At NIST, these measurement capabilities will evolve into a calibration service for diffuse spectral reflectance in this wavelength region.|
|Location:||San Diego, CA|
|Dates:||August 3-7, 2009|
|Keywords:||Absolute Reflectance, Bi-Directional Reflectance Factors, Infrared, Pressed PTFE|
|Research Areas:||Optical Properties of Materials|
|PDF version:||Click here to retrieve PDF version of paper (164KB)|