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Publication Citation: The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm

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Author(s): Howard W. Yoon; David W. Allen; George P. Eppeldauer; Benjamin K. Tsai;
Title: The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm
Published: August 21, 2009
Abstract: Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility are described. The determination of bi-directional reflectance factor with low uncertainties requires the exInGaAs radiometer to be characterized for low-noise performance, linearity and spatial uniformity. The instrument characterizations will be used to establish a total uncertainty budget for the reflectance factor. To independently check the bi-directional reflectance factors, measurements also were made in a separate facility in which the reflectance factor is determined using calibrated spectral irradiance and radiance standards. The total combined uncertainties for the diffuse reflectances range from < 1 % at 1100 nm to 2.5 % at 2500 nm. At NIST, these measurement capabilities will evolve into a calibration service for diffuse spectral reflectance in this wavelength region.
Proceedings: SPIE
Location: San Diego, CA
Dates: August 3-7, 2009
Keywords: Absolute Reflectance; Bi-Directional Reflectance Factors; Infrared; Pressed PTFE
Research Areas: Optical Properties of Materials
PDF version: PDF Document Click here to retrieve PDF version of paper (164KB)