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|Author(s):||David R. Black; Joseph C. Woicik; Martine Duff; Douglas Hunter; Arnold Burger; Michael Groza;|
|Title:||X-Ray Topography to Characterize Surface Damage on CdZnTe Crystals|
|Published:||January 07, 2008|
|Abstract:||Synthetic CdZnTe or CZT crystals can be used for room temperature detection of ?-radiation. Structural/morphological heterogeneities within CZT, such as twinning, secondary phases (often referred to as inclusions or precipitates), and polycrystallinity can affect detector performance. As part of a broader study using synchrotron radiation techniques to correlate detector performance to microstructure, x-ray topography (XRT) has been used to characterize CZT crystals. We have found that CZT crystals almost always have a variety of residual surface damage. Specific structures are identifiable as resulting from fabrication processes and from handling and shipping of sample crystals. Etching was found to remove this damage; however, the detector performance of the etched surfaces was inferior to the as-polished surface due to higher surface currents which result in more peak tailing and less energy resolution.|
|Proceedings:||Proceedings of the MRS Conference | Fall | 2007 ||
|Dates:||November 26-30, 2007|
|Keywords:||CdZnTe,detectors,surface damage,x-ray topography|
|Research Areas:||Ceramics, Characterization|