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Publication Citation: X-Ray Topography to Characterize Surface Damage on CdZnTe Crystals

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Author(s): David R. Black; Joseph C. Woicik; Martine Duff; Douglas Hunter; Arnold Burger; Michael Groza;
Title: X-Ray Topography to Characterize Surface Damage on CdZnTe Crystals
Published: January 07, 2008
Abstract: Synthetic CdZnTe or CZT crystals can be used for room temperature detection of ?-radiation. Structural/morphological heterogeneities within CZT, such as twinning, secondary phases (often referred to as inclusions or precipitates), and polycrystallinity can affect detector performance. As part of a broader study using synchrotron radiation techniques to correlate detector performance to microstructure, x-ray topography (XRT) has been used to characterize CZT crystals. We have found that CZT crystals almost always have a variety of residual surface damage. Specific structures are identifiable as resulting from fabrication processes and from handling and shipping of sample crystals. Etching was found to remove this damage; however, the detector performance of the etched surfaces was inferior to the as-polished surface due to higher surface currents which result in more peak tailing and less energy resolution.
Conference: MRS Conference
Proceedings: Proceedings of the MRS Conference | Fall | 2007 |
Dates: November 26-30, 2007
Keywords: CdZnTe;detectors;surface damage;x-ray topography
Research Areas: Characterization, Ceramics