Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Bruce D. Ravel; Charles E. Bouldin; H Renevier; J -. Hodeau; J -. Berar;|
|Title:||X-Ray-Absorption Edge Separation Using Diffraction Anomalous Fine-Structure|
|Published:||July 01, 1999|
|Abstract:||When two or more absorption edges in a material are sufficiently close in energy, Extended X-ray-Absorption Fine-Structure (EXAFS) spectroscopy may be of limited utility as the usable data range above the lower energy edge is truncated by the presence of the higher energy edge. Energy of wavelength discriminating detection methods may fail to resolve fluorescence lines which are very close in energy. In this paper we present a novel solution to this problem using the resolution in momentum transfer of the Diffraction Anomalous Fine-Structure (DAFS) to separate the fine structure signals from elements with closely spaced fluorescence lines. We demonstrate our technique by isolating the titanium edge signal from DAFS measurements of BaTiO3.|
|Citation:||Physical Review B (Condensed Matter and Materials Physics)|
|Research Areas:||Characterization, Ceramics|