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Angle-dependent infrared reflectance measurements in support of VIIRS

Published

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, Enrique J. Iglesias

Abstract

We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 um to 20 um wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of approximately f/25. Measurements are performed in either absolute mode, or relative to a reference mirror that has been calibrated at near-normal incidence using an integrating sphere-based reflectometer. Uncertainties in the 0.2 % to 0.5 % range are achieved using a photoconductive 77 K InSb detector from 1 um to 5 um and a 12 K Si:As BIB detector from 2 um to 20 um. The performance of the system has been tested using dielectric materials such as Si as well as high-quality Au mirrors. We describe measurements of SiOx-coated Ag mirrors similar to the half-angle mirror (HAM) used in the VIIRS optical scanning system. Various coatings are analyzed to help assess the effect of p-polarized absorption bands at angles from 10° to 65° and wavelengths between 3 um and 13 um.
Proceedings Title
SPIE Infrared Spaceborne Remote Sensing and Instrumentation XVI
Volume
7082
Conference Dates
August 10-14, 2008
Conference Location
San Diego, CA

Keywords

infrared, optical coatings, polarization, radiometry, reflectance

Citation

Kaplan, S. , Hanssen, L. and Iglesias, E. (2008), Angle-dependent infrared reflectance measurements in support of VIIRS, SPIE Infrared Spaceborne Remote Sensing and Instrumentation XVI, San Diego, CA (Accessed March 28, 2024)
Created August 14, 2008, Updated February 19, 2017