NIST logo

Publication Citation: Angle-dependent infrared reflectance measurements in support of VIIRS

NIST Authors in Bold

Author(s): Simon G. Kaplan; Leonard M. Hanssen; Enrique J. Iglesias;
Title: Angle-dependent infrared reflectance measurements in support of VIIRS
Published: August 14, 2008
Abstract: We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 um to 20 um wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of approximately f/25. Measurements are performed in either absolute mode, or relative to a reference mirror that has been calibrated at near-normal incidence using an integrating sphere-based reflectometer. Uncertainties in the 0.2 % to 0.5 % range are achieved using a photoconductive 77 K InSb detector from 1 um to 5 um and a 12 K Si:As BIB detector from 2 um to 20 um. The performance of the system has been tested using dielectric materials such as Si as well as high-quality Au mirrors. We describe measurements of SiOx-coated Ag mirrors similar to the half-angle mirror (HAM) used in the VIIRS optical scanning system. Various coatings are analyzed to help assess the effect of p-polarized absorption bands at angles from 10° to 65° and wavelengths between 3 um and 13 um.
Proceedings: SPIE Infrared Spaceborne Remote Sensing and Instrumentation XVI
Volume: 7082
Pages: pp. 1 - 10
Location: San Diego, CA
Dates: August 10-14, 2008
Keywords: infrared; optical coatings; polarization; radiometry; reflectance
Research Areas: Optics