Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Simon G. Kaplan; Leonard M. Hanssen; Enrique J. Iglesias;|
|Title:||Angle-dependent infrared reflectance measurements in support of VIIRS|
|Published:||August 14, 2008|
|Abstract:||We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 um to 20 um wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of approximately f/25. Measurements are performed in either absolute mode, or relative to a reference mirror that has been calibrated at near-normal incidence using an integrating sphere-based reflectometer. Uncertainties in the 0.2 % to 0.5 % range are achieved using a photoconductive 77 K InSb detector from 1 um to 5 um and a 12 K Si:As BIB detector from 2 um to 20 um. The performance of the system has been tested using dielectric materials such as Si as well as high-quality Au mirrors. We describe measurements of SiOx-coated Ag mirrors similar to the half-angle mirror (HAM) used in the VIIRS optical scanning system. Various coatings are analyzed to help assess the effect of p-polarized absorption bands at angles from 10° to 65° and wavelengths between 3 um and 13 um.|
|Proceedings:||SPIE Infrared Spaceborne Remote Sensing and Instrumentation XVI|
|Pages:||pp. 1 - 10|
|Location:||San Diego, CA|
|Dates:||August 10-14, 2008|
|Keywords:||infrared, optical coatings, polarization, radiometry, reflectance|